1995
DOI: 10.1016/0254-0584(94)01457-r
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In situ X-ray diffraction study of the formation of TiSi2-C49 phase from Ti-Si multilayers on Si(100)

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Cited by 2 publications
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“…53,56 Indeed, in most crystallization processes, nucleation will proceed so fast compared to the growth stage that the entire process may practically be regarded as a (pseudo)-first-order transformation limited primarily to diffusion. 54,57 However, during circumstances where the role of nucleation becomes significant or even rate-determining, the lack of a saturated nucleation rate, especially at the earliest stages of crystallization, may strongly affect the physical meaning of K. 53 Therefore, one should be careful of using K as a parameter in any further interpretation of, for example, activation energies. Instead, an expression for the apparent activation energy representative of the entire crystallization process, E a app , can be derived by noting that the time t x required to reach a certain crystalline volume fraction, for example, t 0.05 , t 0.50 , and t 0.99 , frequently follows an Arrhenius-like relationship 58−62…”
Section: ■ Methodologymentioning
confidence: 99%
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“…53,56 Indeed, in most crystallization processes, nucleation will proceed so fast compared to the growth stage that the entire process may practically be regarded as a (pseudo)-first-order transformation limited primarily to diffusion. 54,57 However, during circumstances where the role of nucleation becomes significant or even rate-determining, the lack of a saturated nucleation rate, especially at the earliest stages of crystallization, may strongly affect the physical meaning of K. 53 Therefore, one should be careful of using K as a parameter in any further interpretation of, for example, activation energies. Instead, an expression for the apparent activation energy representative of the entire crystallization process, E a app , can be derived by noting that the time t x required to reach a certain crystalline volume fraction, for example, t 0.05 , t 0.50 , and t 0.99 , frequently follows an Arrhenius-like relationship 58−62…”
Section: ■ Methodologymentioning
confidence: 99%
“…Assuming that the adsorption coefficient is negligible in the coatingswhich usually is the case among thin films and coatingsand that no significant change in texturing occurs throughout the phase transformation, the diffracted Bragg intensity I can, at any given time t , be treated according to , where V t denotes the volume fraction transformed of the crystalline phase in the analyzed sample. Because V t is enclosed in [0, 1], unity-based normalization of the obtained intensity data must be made from the equation where I t norm is the total gross counts at t , I 0 is the background intensity, and I ∞ is the constant gross counts at the end of the run period. By convention, I ∞ is defined as the I 0.99 level, that is, where 99% of the crystallization has been completed.…”
Section: Methodsmentioning
confidence: 99%
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