2002
DOI: 10.1016/s0921-5093(01)01943-8
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In-situ X-ray diffraction study about uniaxial deformation behavior in a copper single crystal

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Cited by 11 publications
(1 citation statement)
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“…Han et al [2] studied the rotation of the crystallographic orientations of a pure aluminum single crystal during an in-situ uniaxial tension test in a scanning electron microscope by using an electron backscattered diffraction (EBSD) system. Kim and Koo [3] observed deformation behaviors of a copper single crystal by an in-situ reflection Laue method using synchrotron radiation and they examined the activated slip systems during deformation. Florando et al [4] showed that the activity on the primary slip system as well as appreciable activity orthogonal to this system by using the digital image correlation (DIC) method during uniaxial compression of copper single crystals which were oriented for slip system.…”
Section: Introductionmentioning
confidence: 99%
“…Han et al [2] studied the rotation of the crystallographic orientations of a pure aluminum single crystal during an in-situ uniaxial tension test in a scanning electron microscope by using an electron backscattered diffraction (EBSD) system. Kim and Koo [3] observed deformation behaviors of a copper single crystal by an in-situ reflection Laue method using synchrotron radiation and they examined the activated slip systems during deformation. Florando et al [4] showed that the activity on the primary slip system as well as appreciable activity orthogonal to this system by using the digital image correlation (DIC) method during uniaxial compression of copper single crystals which were oriented for slip system.…”
Section: Introductionmentioning
confidence: 99%