“…The amplified signals from the detector plane are then analyzed to obtain information regarding phase fractions, crystal structure, morphology, grain size, orientation, etc. [14,43,48,69,74,[83][84][85][86][87] Corresponding 1D diffraction patterns are then obtained from the 2D patterns using the FIT2D software package, [79,83,84,87] as shown in Figure 6. Quantitative analysis from these 1D patterns is done by subjecting them to the Rietveld analysis or by direct comparison method.…”