In situ X-ray multilayer reflectometry based on the energy dispersive method

The energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devices

“…In this case, a constraint based on prior information on the densities must be imposed. Another case where high resolution would be required to observe high frequency oscillations, which otherwise are washed out, can be found in [47]. A comparison between an ADXR and an EDXR measurement can be found in [68], where the same sample (a stack of 12 monolayers of Mg stearate) was studied using both techniques.…”

“…In section 5, papers concerning the use of EDXR to obtain morphological information will be reviewed [33][34][35][36][37][38][39][40][41][42][43]. Finally in section 6, a particular aspect of the laboratory EDXR technique, time-resolved in situ investigations to observe the modifications occurring in stratified systems undergoing morphological changes, will be examined in depth [44][45][46][47][48][49][50][51]. To this category belong, for instance, oxide films growing on clean (solid or liquid) surfaces, organic films submitted to thermal treatments (annealing), films deposited on substrates by thermal or electron beam evaporations and ion beam sputtering, organic solar cells upon illumination and sensing films exposed to gases or water vapours.…”

Controlling photoinduced degradation in plastic photovoltaic cells: A time-resolved energy dispersive x-ray reflectometry study

“…15,16 The bulk heterojunction solar cells studied were made from a blend of methanofullerene͓6,6͔-phenyl C 61 butyric acid methylester, denoted by PCBM, and MDMO-PPV. The cells consisted of an indium tin oxide ͑ITO͒ substrate cleaned in an ultrasonic bath with acetone and isopropanol, rinsed in de-ionized water, dried in an oven, and finally treated with UV ozone.…”

Relationship between dislocations and residual stresses in cold-drawn pearlitic steel analyzed by energy-dispersive X-ray diffraction

“…Meanwhile, the reciprocal-space resolution in the EDXD method is a function of scattering angle, and the effect of the energy resolution of the SSD on the reciprocal-space resolution can be reduced at small scattering angles. In fact, at small enough scattering angles, a fine oscillation pattern can be successfully obtained in X-ray reflectivity profiles for thin films on substrates [11,12]. Therefore, we expect that the line-profile analysis can be carried out in the energy-dispersive mode with better reciprocal-space resolution by setting an appropriate scattering angle.…”