In Situ X-Ray Reciprocal Space Mapping for Characterization of Nanomaterials

Šiffalovič, Peter; Végsö, Karol; Hodas, Martin; Jergel, M.; Pelletta, Marco; Korytár, D.; Zápražný, Zdenko; Majková, E.

doi:10.1007/978-3-662-48606-1_9

Cited by 3 publications

(2 citation statements)

References 74 publications

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“…Multifitting offers two 'basic' lateral correlation function models, which are both isotropic. The first is the ABC or Kcorrelation model (Siffalovic et al, 2011;Bass, 1995),…”

Section: Diffuse Scatteringmentioning

confidence: 99%

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Multifitting 2: software for reflectometric, off-specular and grazing-incidence small-angle scattering analysis of multilayer nanofilms

Svechnikov

2024

J Appl Crystallogr

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Multifitting is a computer program that was originally designed to model the reflection and transmission of shortwave radiation by multilayer nanofilms. Three years have passed since the introduction of this software, and in this paper the focus is on describing the possibilities of Multifitting with regard to off-specular diffuse scattering and grazing-incidence small-angle scattering. The approach to the user interface and to working with the structure model remains the same, and the emphasis is on the ergonomics, calculation speed and intensive use of the program for technological and research tasks. However, the scope of the program has been expanded to make it more useful to existing users, and it may also be of interest to a wider audience.

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“…Multifitting offers two 'basic' lateral correlation function models, which are both isotropic. The first is the ABC or Kcorrelation model (Siffalovic et al, 2011;Bass, 1995),…”

Section: Diffuse Scatteringmentioning

confidence: 99%

“…The second approach is the stretched exponential model (Siffalovic et al, 2011;Sinha et al, 1988;Palasantzas, 1993), which includes the same three parameters,…”

Section: Diffuse Scatteringmentioning

confidence: 99%

Multifitting 2: software for reflectometric, off-specular and grazing-incidence small-angle scattering analysis of multilayer nanofilms

Svechnikov

2024

J Appl Crystallogr

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Advanced optical characterization of nanostructures and nanomaterials in the X-ray range

Majková

Šiffalovič

Végsö

et al. 2016

2016 Progress in Electromagnetic Research Symposium (PIERS)

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X-ray diffraction methods for structural diagnostics of materials: progress and achievements

Fetisov

2020

Phys.-Usp.

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The development of X-ray diffractometry at the turn of the 21st century is presented. The review covers instrumentation development for structural studies based on the use of both standard continuously radiating X-ray generators and state-of-the-art sources of ultrashort and ultra-bright X-ray pulses. The latter technique enables investigation of the structural dynamics of condensed matter in a 4D space–time continuum with a resolution reaching a tenth of a femtosecond. New engineering approaches to enhancing the sensitivity, accuracy, and efficiency of X-ray diffraction experiments are discussed, including new and promising X-rays sources, reflective collimating and focusing X-ray optical devices, and fast low-noise and radiation-resistant position-sensitive X-ray detectors, as well as a new generation of X-ray diffractometers developed based on these elements. The presentation is focused on modern engineering solutions that enable academic and applied-research laboratories to perform X-ray diffraction studies on-site, which earlier were only feasible using synchrotron radiation sources at international resource sharing centers.

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In Situ X-Ray Reciprocal Space Mapping for Characterization of Nanomaterials

Cited by 3 publications

References 74 publications

Multifitting 2: software for reflectometric, off-specular and grazing-incidence small-angle scattering analysis of multilayer nanofilms

Multifitting 2: software for reflectometric, off-specular and grazing-incidence small-angle scattering analysis of multilayer nanofilms

Advanced optical characterization of nanostructures and nanomaterials in the X-ray range

X-ray diffraction methods for structural diagnostics of materials: progress and achievements

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