In situatomic-scale observation of the conversion behavior in a Cu-Zn alloy for twinnability enhancement

Atomic Imaging and Thermally Induced Dynamic Structural Evolution of Two-Dimensional Cr2S3

“…TEM is a powerful technique for analyzing microstructures, providing atomic-resolution images and diffraction information. − The development of in situ TEM provides insight into the dynamic structural evolution at the atomic scale, which yields direct evidence for atomic motion under different environmental conditions (i.e., annealing and bias). − In addition, the use of in situ heat TEM techniques to observe 2D materials facilitates the engineering design of 2D material devices as well as phenomenological studies . In this study, we deduced the consecutive atomic motion trajectory during the phase transition by combining in situ heat STEM images and atomic-resolution images.…”

In situ transmission electron microscopy (TEM) study on the structural evolution behavior of nano Sn sheets under a thermal field

“…Its spatial resolution has achieved the sub-nanometer scale, enabling the observation of material properties at the subatomic level, thus rendering it an indispensable tool in the field of materials science. [40][41][42][43][44][45][46][47][48][49][50][51][52][53] Currently, the in situ technology based on Cs-TEM is rapidly advancing and has become a ubiquitous tool in nanotechnology, elevating Cs-TEM to a comprehensive nanoscale laboratory. [54][55][56][57][58][59][60][61][62][63] By utilizing the in situ Cs-TEM, we can dynamically observe a multitude of structural changes as well as physical and chemical properties in materials and devices in real-time.…”

In Situ TEM Observation of Electron‐Beam‐Induced Microstructural Evolution in van der Waals Layered Magnetic CrSBr Semiconductor

“…In situ transmission electron microscopy (TEM) is a powerful technique that not only provides atomic-scale highresolution images for understanding the microstructure, but also helps record the dynamic behavior of a sample in response to internal electron beam irradiation and externally applied heat or bias. [30,31] In the past decade, such in situ TEM techniques have been used to gain insight into memory nanodevices, [32] the solid-state diffusion of metal oxides, [33] heterostructure fabrication, [34,35] and nanostructure sculpting. [36,37] As CrSBr is considered a beam-sensitive material, it is easily damaged under electron beam irradiation.…”