In the banana crop, leaf area is a fundamental trait for production; however, monitoring this variable during a cycle is difficult due to the structural characteristics of the plant, and a method for its determination is necessary. Therefore, the objective of this research was to propose a model for estimating total leaf area by measuring the cross-sectional area of the pseudostem to identify when meristematic differentiation occurs. In plants between F10 and flowering, functional leaves were measured for length, width, and dry mass. Cross-sectional area was calculated every 10 cm from the base to 70 cm, at ⅓, ½ of the plant height and up to the last pair of leaves. From the principal components, the cross-sectional measurement at 50 cm was selected, obtaining a nonlinear model for indirect estimation of leaf area. Subsequently, Fisher’s linear discriminant analysis was used with the parameters associated with the number of leaves emitted and the estimated leaf area to obtain the cutoff point as the centroid of the extracted components. As an indicator for the approximate identification of the moment of meristem differentiation, the emission of leaf 12 was generated, which determines the phenological stage (vegetative-reproductive) of the plant. The results describe tools to follow up the growth in the productive units to facilitate crop monitoring, allowing the generation of differential production approaches.