2008
DOI: 10.1088/1742-6596/100/4/042017
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InAs film grown on Si(111) by metal organic vapor phase epitaxy

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Cited by 10 publications
(11 citation statements)
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“…Also, a change of growth parameters directly affects the electrical characteristics of the samples. As previously stated, lowering the AsH 3 flow and raising the growth temperature results in higher mobility films [6].…”
Section: Electrical Characterizationmentioning
confidence: 62%
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“…Also, a change of growth parameters directly affects the electrical characteristics of the samples. As previously stated, lowering the AsH 3 flow and raising the growth temperature results in higher mobility films [6].…”
Section: Electrical Characterizationmentioning
confidence: 62%
“…Previously, we have reported MOVPE growth of thick InAs layers on Si (1 1 1) substrates [6,7]. However, even for samples of 2 mm thickness, holes remained on the surface.…”
Section: Introductionmentioning
confidence: 94%
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