“…Also, a change of growth parameters directly affects the electrical characteristics of the samples. As previously stated, lowering the AsH 3 flow and raising the growth temperature results in higher mobility films [6].…”
Section: Electrical Characterizationmentioning
confidence: 62%
“…Previously, we have reported MOVPE growth of thick InAs layers on Si (1 1 1) substrates [6,7]. However, even for samples of 2 mm thickness, holes remained on the surface.…”
Section: Introductionmentioning
confidence: 94%
“…Deposition of InAs on Si using one nucleation step results in layers with holes remaining on the surface [6]. To investigate the effect of incorporating more nucleation layers, we have grown a set of six samples with one to six nucleation layers.…”
Section: Structural Characterizationmentioning
confidence: 99%
“…We have studied the effect of lowering the V/III ratio on the surface morphology using the same Counts per second (a.u.) 6 temperature for the InAs layer growth by means of AFM measurement. The study has been performed by keeping the TEGa molar fraction constant and lowering the TMSb molar fraction.…”
Section: Gasb On Inasmentioning
confidence: 99%
“…After the nucleation step, the temperature is ramped up and the nucleation layer is annealed for 6 min. This annealing step helps Ostwald ripening and improves the InAs surface coverage [6]. In the case of multiple nucleation layers, the same nucleation and annealing steps are repeated.…”
“…Also, a change of growth parameters directly affects the electrical characteristics of the samples. As previously stated, lowering the AsH 3 flow and raising the growth temperature results in higher mobility films [6].…”
Section: Electrical Characterizationmentioning
confidence: 62%
“…Previously, we have reported MOVPE growth of thick InAs layers on Si (1 1 1) substrates [6,7]. However, even for samples of 2 mm thickness, holes remained on the surface.…”
Section: Introductionmentioning
confidence: 94%
“…Deposition of InAs on Si using one nucleation step results in layers with holes remaining on the surface [6]. To investigate the effect of incorporating more nucleation layers, we have grown a set of six samples with one to six nucleation layers.…”
Section: Structural Characterizationmentioning
confidence: 99%
“…We have studied the effect of lowering the V/III ratio on the surface morphology using the same Counts per second (a.u.) 6 temperature for the InAs layer growth by means of AFM measurement. The study has been performed by keeping the TEGa molar fraction constant and lowering the TMSb molar fraction.…”
Section: Gasb On Inasmentioning
confidence: 99%
“…After the nucleation step, the temperature is ramped up and the nucleation layer is annealed for 6 min. This annealing step helps Ostwald ripening and improves the InAs surface coverage [6]. In the case of multiple nucleation layers, the same nucleation and annealing steps are repeated.…”
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