Incident beam diffraction effects in Auger electron emission from crystal surfaces

Gomoyunova, M. V.; Dudarev, S. L.; Pronin, I. I.

doi:10.1016/0039-6028(90)90790-f

Cited by 27 publications

(2 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Using the density matrix defined in Eq. per, r', E) = po(r, r', E) + J drl J dr2 G(r,rl,E) G*(r',r2,E) J dhw [S(r2,rl,hw) p(rl,r2,E + hw)] (14.36) This equation was derived by Dudarev (1991), and it was applied to the study of diffraction effects in Auger electron emission (Gomoyunova et al, 1990), TOS in RHEED 1993b), multiple plasmon excitation (Dudarev et ai., 1992), and diffraction of backscattered electrons (Gorodnichev, 1990). A more rigorous derivation of the kinetic equation for a system in thennal equilibrium with the environment was described in detail by Dudarev et al (1993a).…”

Section: Kinetic Equation Of Multiple Inelastic Electron Scatteringmentioning

confidence: 99%

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Wang

1995

143

101

View full text Add to dashboard Cite

All rights reservedNo part of this book may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, microfilming, recording, or otherwise, without written permission from the Publisher Preface Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed extensively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics.The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. , who have kindly allowed me to use their illustrations and results in the text. v vi Preface This book was written in my spare time after working hours. I am heartily grateful to my wife, Cui Xia Yuan, for her encouragement and understanding. This book would have been impossible without her support.Zhong Lin Wang • New imaging techniques using inelastically scattered electrons: In recent years, great interest has developed in structural determination using inelastically scattered electrons. High-angle annular dark-field imaging in STEM, for example, is based on the signal of high-angle phonon-scattered electrons. This imaging technique may provide atomic-number-sensitive structural information with a resolution superior to conventional bright-field imaging.operator Volume of an atom Dynamic scattering operator xxvi <> <>E J(z,Eo -Lili) LT IE fs(u) e p(r, r', E) s(r, r, flw) Symbols and Definitions Time average Average over system energy Energy distribution function of plural inelastically scattered electrons Laplace transform Energy distribution function of single-loss electrons Angular distribution function of single-loss electrons Three-dimensional solid angle One-particle density matrix Energy-dependent mixed dynamic form factor Sign Conventions Free-space plane wave exp (2n...

show abstract

Section: Kinetic Equation Of Multiple Inelastic Electron Scatteringmentioning

confidence: 99%

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Wang

1995

143

101

View full text Add to dashboard Cite

show abstract

“…Beyond the applicability to determining the relationship between localized excitations and stimulated desorption, our method can contribute to our understanding of other electron-surface probes, most notably Auger electron spectroscopy [15,19], where knowledge of incident beam diffraction (IBD) effects is necessary for the quantitative interpretation of data. Some studies have concluded that IBD is negligible compared to exit beam diffraction [20], while others maintain that IBD is important [19,21]. Since stimulated desorption does not suffer from detectable diffraction of the outgoing ion, it offers a way to measure incident beam diffraction independent of exit beam effects.…”

mentioning

confidence: 99%

Stimulated Desorption by Surface Electron Standing Waves

1999

View full text Add to dashboard Cite

The total electron-stimulated desorption yield of Cl 1 ions from the Cl-terminated Si(111) surface is shown to exhibit fine-structure oscillations as a function of incident electron beam direction. We demonstrate that this fine structure is consistent with quantum-mechanical scattering and interference of the incident electron. Comparison of experimental data to a qualitative theory reveals the site of the excitation responsible for desorption, and the ground-state atomic bonding geometry of the desorbate. The data are consistent with desorption initiated by an excitation localized on the Si atom bonded to Cl.[S0031-9007(99)08922-X] PACS numbers: 79.20.La, 61.14.Dc, 79.60.Dp Materials modification by electron or photon beams and the desorption of surface-bound species induced by electronic transitions are phenomena of both technological and fundamental importance. The physics of desorption induced by electronic transitions, particularly electronstimulated desorption (ESD) [1], is the basis for electronbeam induced processes in materials growth and etching, lithography, hot-electron induced defects in devices, radiation damage, and is important for other disciplines, including astrophysics [2]. Stimulated desorption is also a concern in many traditional surface probes such as photoemission, low energy electron diffraction (LEED), and electron microscopy since it results in damage. One issue central to understanding stimulated desorption is the relationship between the atomic and electronic structure of a surface species and its desorption probability. The majority of effort in experimental and theoretical ESD has focused on the mechanisms of desorption following excitation, of which the two most prominent are the Menzel-Gomer-Redhead and Knotek-Feibelman mechanisms [3,4]. These models have motivated the description of the desorption cross sections as the product of the excitation (inelastic electron-solid scattering) cross section and the total desorption or escape probability.An aspect of stimulated desorption that has received much less attention is diffraction of the incident electron beam. Interference of the direct (or unscattered) electron wave with waves elastically scattered from the crystal lattice forms a "standing wave," with spatially localized maxima and minima in the incident electron density. Whether a particular site on a surface experiences a maximum or minimum depends on the wavelength (energy) of the electron, the direction of incidence relative to the crystal axes, and the arrangement of atoms in the lattice [see Fig. 1(a)]. Since the probability of desorption is proportional to the incident electron density at the site of the "absorber" (the site of the electronic excitation leading to desorption), the total ESD cross section should depend upon the local atomic structure and the k vector of the incident wave.Electron diffraction has been previously observed to affect photon-stimulated desorption (PSD) measurements, through the extended x-ray absorption fine-structure effect [5,6]. These studie...

show abstract

Epitaxial Growth of Metallic Structures

Bland

Heinrich

1994

Ultrathin Magnetic Structures I

View full text Add to dashboard Cite

Incident beam diffraction effects in Auger electron emission from crystal surfaces

Cited by 27 publications

References 19 publications

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Stimulated Desorption by Surface Electron Standing Waves

Epitaxial Growth of Metallic Structures

Contact Info

Product

Resources

About