Incident Energy Dependence of the Molecular Orientation Effect of MeV \(\text{C}_{2}^{ + }\) Projectiles in Secondary-Ion Emission Processes

Murase, Ryu; Tsuchida, H.; Nakagawa, Sohei; Tomita, S.; Chiba, Ayano; Nakajima, K.; Majima, T.; Saito, Manabu

doi:10.7566/jpsj.91.024302

J. Phys. Soc. Jpn.

2022

DOI: 10.7566/jpsj.91.024302

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Incident Energy Dependence of the Molecular Orientation Effect of MeV \(\text{C}_{2}^{ + }\) Projectiles in Secondary-Ion Emission Processes

Ryu Murase

H. Tsuchida

Sohei Nakagawa

et al.

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Incident Energy Dependence of the Molecular Orientation Effect of MeV \(\text{C}_{2}^{ + }\) Projectiles in Secondary-Ion Emission Processes

Cited by 2 publications

References 36 publications

Effect of molecular axis orientation of 3.6 MeV Si2+ projectiles on the ion-induced secondary electron emission from a carbon foil

Effect of molecular axis orientation of 3.6 MeV Si2+ projectiles on the ion-induced secondary electron emission from a carbon foil

Forward and backward emission of secondary ions from biomolecules on single-layer graphene by MeV C+ (n = 1–6) impacts

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