Abstract:This article deals with fault detection and the classification of incipient and intermittent open-transistor faults in grid-connected three-level T-type inverters. Normally, open-transistor detection algorithms are developed for permanent faults. Nevertheless, the difficulty to detect incipient and intermittent faults is much greater, and appropriate methods are required. This requirement is due to the fact that over time, its repetition may lead to permanent failures that may lead to irreversible degradation.… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.