This paper is an extended version of work published in IPFA 2020. In the previous paper, advanced physical failure analysis (PFA) techniques for rescuing damaged samples with cracks, scratches, or unevenness in delayering are introduced. In the present work, the techniques will be further exploited and summarized for the potential applications in general devices. The three typical rescue cases will be fully discussed through comprehensive analysis on the failure mechanism and the rescuing process. Compared to the conventional PFA techniques that normally require back-up samples, the novel rescue techniques offer more alternative solutions for coping with sample damage problems in delayering without starting over with a new sample that would waste machine time and human resources. These new PFA techniques involve only basic failure analysis (FA) skills that could be easily manipulated and FA equipment that is commonly available in FA labs, and would extend the scope and capability of the tradition PFA to help the FA engineers deliver FA results with high quality and high success rate in the daily work, especially for handling "one of a kind" devices.