2003
DOI: 10.1364/ao.42.005670
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Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry—application to absolute long gauge block measurement

Abstract: An instrument for step-height measurement by multiple-wavelength interferometry is described. The addition of a 1152-nm wavelength to a multiple-wavelength scheme applying wavelengths of 633, 612, and 543 nm relaxes the tolerance range of the required preliminary measurement to +/- 140 microm, if the total uncertainty in the fringe fraction measurement can be kept below 2%. For larger fringe fraction measurement uncertainty, numerical simulations show that the integer number of interference orders can still be… Show more

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Cited by 56 publications
(26 citation statements)
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“…Especially when a multiplewavelength technique is utilized, the measurement can be performed point by point without any spatial phase unwrapping; therefore, the step-height is not a problem at all. Over the years, extensive research has been conducted on two-or multiple-wavelength phase-shifting techniques [1][2][3][4][5][6][7][8][9][10][11][12][13][14] and temporal phase unwrapping. 15,16 All these efforts were intending to measure the step-height object or alleviate the limitations of phase unwrapping.…”
Section: Introductionmentioning
confidence: 99%
“…Especially when a multiplewavelength technique is utilized, the measurement can be performed point by point without any spatial phase unwrapping; therefore, the step-height is not a problem at all. Over the years, extensive research has been conducted on two-or multiple-wavelength phase-shifting techniques [1][2][3][4][5][6][7][8][9][10][11][12][13][14] and temporal phase unwrapping. 15,16 All these efforts were intending to measure the step-height object or alleviate the limitations of phase unwrapping.…”
Section: Introductionmentioning
confidence: 99%
“…They were used widely to measure larger step height. [8][9][10][11] Huntley et al proposed a technique called temporal phase unwrapping algorithm 12 and apply it to measure discontinuous objects. 13 The fundamental concept of this technique is that the phase is unwrapped in time axis rather than in x − y plane spatially.…”
Section: Introductionmentioning
confidence: 99%
“…This is achieved without the need for closely separated measurement wavelengths. The results of this work have numerous applications in absolute distance metrology [20,21,[27][28][29], discrete wavemeters [30,31], and full-field MWI and profilometry techniques [7-9, 22, 24,32], or multi-wavelength digital holography [33][34][35]. Fig.…”
Section: Discussionmentioning
confidence: 99%