International Symposium on Power Electronics, Electrical Drives, Automation and Motion, 2006. SPEEDAM 2006.
DOI: 10.1109/speedam.2006.1649896
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Indirect reliability estimation for electric devices via a dynamic "Stress-strength" model

Abstract: In the paper, the problem of an efficient assessment or estimation of the reliability function of power system devices subjected to repeated "shocks" (e.g. overvoltages) is dealt with. The adopted model is a dynamic "Stress-Strength" model, leading to an Exponential reliability model, whose parameters are functions of electric system parameters or characteristics (e.g., frequency of overvoltages occurrence, their amplitude distribution, the degradation law of component insulation, etc). By adequately using the… Show more

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Cited by 4 publications
(2 citation statements)
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“…Many papers (Li and Pham 2005;Li and Pham 2005;Deloux et al 2009;Mori and Ellingwood 1994;van Noortwijk et al 2007;Lehmann 2009;Ciampoli 1998;Chiodo and Mazzanti 2006;Hosseini et al 2000;Klutke and Yang 2002;Satow et al 2000;) study the competing models for degradation and random shocks, and also the maintenance policies for this kind of system. However, most of them assume they are two independent processes.…”
Section: A Combination Methods For Degradation and Random Shockmentioning
confidence: 99%
See 1 more Smart Citation
“…Many papers (Li and Pham 2005;Li and Pham 2005;Deloux et al 2009;Mori and Ellingwood 1994;van Noortwijk et al 2007;Lehmann 2009;Ciampoli 1998;Chiodo and Mazzanti 2006;Hosseini et al 2000;Klutke and Yang 2002;Satow et al 2000;) study the competing models for degradation and random shocks, and also the maintenance policies for this kind of system. However, most of them assume they are two independent processes.…”
Section: A Combination Methods For Degradation and Random Shockmentioning
confidence: 99%
“…Chiodo and Mazzanti (2006) deal with the problem of the reliability function assessment for power system devices due to repeated shocks. The systems may survive under the condition that the individual stress load is less than the remaining degradation resistance.…”
Section: Introductionmentioning
confidence: 99%