2022
DOI: 10.3390/en16010332
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Indirect Thermographic Temperature Measurement of a Power-Rectifying Diode Die Based on a Heat Sink Thermogram

Abstract: This article concerns the indirect thermographic measurement of the junction temperature of a D00-250-10 semiconductor diode. Herein, we show how the temperature of the semiconductor junction was estimated on the basis of the heat sink temperature. We discuss the methodology of selecting the points for thermographic measurement of the heat sink temperature and the diode case. The method of thermographic measurement of the heat sink temperature and the used measurement system are described. The simulation metho… Show more

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Cited by 2 publications
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“…For this reason, a 3D model is used to obtain more information. In each tetrahedral element (into which the semiconductor diode case is divided), the temperature field is interpolated based on the temperature at the nodes of that element and the linear shape function, Equation (5) [40]:…”
Section: Determining Convection Coefficients and Simulation Boundary ...mentioning
confidence: 99%
“…For this reason, a 3D model is used to obtain more information. In each tetrahedral element (into which the semiconductor diode case is divided), the temperature field is interpolated based on the temperature at the nodes of that element and the linear shape function, Equation (5) [40]:…”
Section: Determining Convection Coefficients and Simulation Boundary ...mentioning
confidence: 99%