“…Track registration is common but not systematic in iono-covalent insulators [14][15][16]. In crystalline semiconductors, ion tracks have been observed by TEM in InSb, InP, GeS, InAs, GaSb, SiGe, and Ge [17][18][19][20][21][22][23] irradiated with SHI, whereas no track was found in GaAs [21] or Si [24,25]. Moreover, at least in InP and GaAs, ion tracks are also formed below S th e if the materials have been previously damaged [26].…”