Industrial Computing Systems: A Case Study of Fault Tolerance Analysis

Abstract

Fault tolerance is a key factor of industrial computing systems design. But in practical terms, these systems, like every commercial product, are under great financial constraints and they have to remain in operational state as long as possible due to their commercial attractiveness. This work provides an analysis of the instantaneous failure rate of these systems at the end of their life-time period. On the basis of this analysis, we determine the effect of a critical increase in the system failure rate and the basic condition of its existence. The next step determines the maintenance scheduling which can help to avoid this effect and to extend the system life-time in fault-tolerant mode.

Smart Electrical Screening Methodology for Channel Hole Defects of 3D Vertical NAND (VNAND) Flash Memory

“…(In industry, this type of test is usually called a burn-in test. Various burn-in tests have been widely used in the quality assessment and certification of various electronic devices [29]). Since we aim to screen out only infant mortality in the bathtub curve [30], we should precisely control the stress conditions, such as voltages, timing, and the number of cycles.…”

“…Various burn-in tests have been widely used in the quality assessment and certification of various electronic devices [28]). Since we aim to screen out only infant mortality in the bath-tub curve [29], we should precisely control the stress conditions, such as voltages, timing, and the number of cycles. For example, under-stress conditions result in a long test time without accelerating Soft channel hole defects, thus eventually raising the cost of flash products.…”