2009 34th IEEE Photovoltaic Specialists Conference (PVSC) 2009
DOI: 10.1109/pvsc.2009.5411146
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Industrial PVD metallization for high efficiency crystalline silicon solar cells

Abstract: In this paper we present first results concerning different thermal evaporation processes for thin aluminum layers, which are carried out on a pilot system with a throughput of up to 540 wafers/h (156x156 mm2). To qualify the processes the deposited aluminum layers were evaluated with respect to homogeneity and conductivity. Additionally the effect of the different processes on the passivation quality of a thermally grown 100 nm thick SiO 2 was analyzed by means of lifetime measurements, indicating a negligibl… Show more

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Cited by 20 publications
(11 citation statements)
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“…In addition, lower specific contact resistance for Al/Si (<0.5 mΩ∙cm 2 ) has also been reported, compared with the Ag/Si (1–2 mΩ∙cm 2 ) . Because the sheet resistance of a 2‐µm‐thick PVD Al layer is just ~0.015 Ω/□ , a thin (1 ~ 2 µm) PVD Al layer on the entire rear area is sufficient to meet the required electrical conductance for large‐area Si solar cells, which further leads to less wafer bow and less Al consumption . On the other hand, in order to obtain a good solder contact to the PVD Al side, depositing a double layer of Ni : V/Ag with respective thickness of 200 and 25 nm on top of PD Al layer can offer an excellent solderability with a peel force greater than 3 N/mm and long‐term stability .…”
Section: Introductionmentioning
confidence: 99%
“…In addition, lower specific contact resistance for Al/Si (<0.5 mΩ∙cm 2 ) has also been reported, compared with the Ag/Si (1–2 mΩ∙cm 2 ) . Because the sheet resistance of a 2‐µm‐thick PVD Al layer is just ~0.015 Ω/□ , a thin (1 ~ 2 µm) PVD Al layer on the entire rear area is sufficient to meet the required electrical conductance for large‐area Si solar cells, which further leads to less wafer bow and less Al consumption . On the other hand, in order to obtain a good solder contact to the PVD Al side, depositing a double layer of Ni : V/Ag with respective thickness of 200 and 25 nm on top of PD Al layer can offer an excellent solderability with a peel force greater than 3 N/mm and long‐term stability .…”
Section: Introductionmentioning
confidence: 99%
“…4 Vacuum evaporation is wellestablished in the packaging industry as a low cost, large area deposition method for the fabrication of thin metal films and is compatible with roll-to-roll deposition onto flexible substrates, as well as offering the necessary high degree of control over metal film thickness. 5 The potential of this approach to achieve comparable device performance to conventional device architectures based on a conducting oxide window electrode has been demonstrated in wholly vacuum deposited small molecule OPVs by the group of Leo, 6 using Ag as the base metal for the transparent electrode. Ag is the metal of choice for this application because it has the highest conductivity 7 and the lowest optical absorbance 8 of the earth abundant metals over the visible spectrum, combined with relatively high stability toward oxidation in air.…”
Section: ■ Introductionmentioning
confidence: 99%
“…The area‐weighted resistance in the finger can be determined in the case of linearly increasing current by italicRitalics=13ρiitaliclnormalF2AF with ρ = 3.2 μΩ cm being the resistivity of the evaporated aluminum , i = 2.3 mm the index width of the fingers, l F the length of the fingers, and A F the cross‐section area of the fingers perpendicular to the direction of transport of the current. The thickness of the Al layer is 25 µm.…”
Section: Analysis Of Gains and Lossesmentioning
confidence: 99%