SUMMARYA product label inspection system implemented on a transputer network is described. Two data routing algorithms are considered, one for a general M x N array and one for a customized setup of transputers. Data transfer results for various image sizes are provided.Reliable and fast label inspection algorithms are described for rectangular, acute-angled and oval-shaped product labels, and their implementation on both the general and the customized networks are discussed. Simulated test results are provided to illustrate the present capability of the system for inspecting large numbers of labels per second.