Proceedings of the 18th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Application 2023
DOI: 10.5220/0011696400003417
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Industrial Visual Defect Inspection of Electronic Components with Siamese Neural Network

Warley Barbosa
1
,
Lucas Amaral
2
,
Tiago Figueiredo Vieira
3
et al.
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