Herein, the purpose is to study the antireflection performance of the silicon surface with a V‐ring groove texture. Based on the principle of geometrical optics, a numerical model of 3D ray tracing is established to calculate the weighted reflectance of the textured silicon surface with V‐ring groove structures, and the calculated results are in good agreement with the measured reflectance results by a mechanical processing experiment. Then, the reflectance of the V‐ring groove textured silicon surface with different parameters is simulated and analyzed through the established model, and better parameters of the V‐ring groove structure for antireflection are determined by considering actual processing conditions. Finally, the weighted reflectance and reflectance spectra of the V‐ring groove textured silicon surface with better parameters are calculated. It is found that the lowest weighted reflectance of the silicon surface with improved V‐ring groove texture is 5.53%, and the lowest weighted reflectance is reduced by about 5%, compared with the chemically etched pyramid texture of which the weighted reflectance is 10.54%. In addition, when the incident angle is less than 50°, the weighted reflectance of the silicon surface with an improved V‐ring groove texture remains less than 10%.