Inelastic electron scattering in amorphous silicon nitride and aluminum oxide with multiple-scattering corrections

Livins, Peteris; Aton, T.; Schnatterly, S. E.

doi:10.1103/physrevb.38.5511

Cited by 28 publications

(7 citation statements)

References 16 publications

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“…Several numerical deconvolution schemes have been developed [12] and applied to EELS data [3,4,13,14]. Following Ref.…”

Section: Exact Determination Of the Loss Functionmentioning

confidence: 99%

“…For a comparison with calculated band-structure data, the optical joint density of states (OJDS), which is defined as [31] 11((0)----2~oe2(co)/~o 2 (14) was calculated from e 2 as derived from the K-K analysis. For a comparison with calculated band-structure data, the optical joint density of states (OJDS), which is defined as [31] 11((0)----2~oe2(co)/~o 2 (14) was calculated from e 2 as derived from the K-K analysis.…”

Section: Optical Properties Of Tic Vc Tin and Vn VIIImentioning

confidence: 99%

See 1 more Smart Citation

Determination of Optical Constants by High-Energy, Electron-Energy-Loss Spectroscopy (EELS)

Pflüger¹,

Fink²

1997

Handbook of Optical Constants of Solids

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“…Several numerical deconvolution schemes have been developed [12] and applied to EELS data [3,4,13,14]. Following Ref.…”

Section: Exact Determination Of the Loss Functionmentioning

confidence: 99%

Section: Optical Properties Of Tic Vc Tin and Vn VIIImentioning

confidence: 99%

Determination of Optical Constants by High-Energy, Electron-Energy-Loss Spectroscopy (EELS)

Pflüger¹,

Fink²

1997

Handbook of Optical Constants of Solids

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“…The same model has been used by Livins et al to analyze the nature of excitons in sapphire and silicon nitride. 18 In both these studies, the binding energies derived for the exciton appeared to be too large to be consistent with the Wannier-Mott limit required for a true Elliot model of the exciton. So the functional expression used to fit the data was viewed as an Elliotlike model which provided an empirical description of the electron-hole interaction with the continuum levels.…”

Section: Elliot-like Model Of a Resonant Excitonmentioning

confidence: 74%

“…18 In this experiment, it was not feasible to correct for multiple scattering because of the weak intensity from the titania particles and because of uncertainties introduced in subtracting the composite and substrate spectra. Typically, the EELS spectrum is not significantly contaminated by multiple scattering below the bulk plasmon peak, and one can roughly scale the data using Kramers-Kronig analysis plus the measured index of refraction.…”

Section: Electron Energy-loss Resultsmentioning

confidence: 99%

Electron energy-loss study of titania particles

Gonzalez

Ritter

1998

J. Mater. Res.

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Small titania particles, prepared by hydrolysis and condensation using in situ steric stabilization, have been studied by high-energy, transmission, electron energy-loss spectroscopy. Electron diffraction patterns and energy-loss spectra as a function of momentum transfer were measured for as-prepared particles (amorphous titania), particles annealed at 600 ± C (primarily anatase), and particles annealed at 1000 ± C (primarily rutile). The energy-loss spectra at low momentum disagreed with the loss function calculated from optical data (rutile) and disagreed with theory (rutile and anatase). The data was fit by an Elliot-like model for a resonant exciton interacting with a continuum of levels. The translational effective mass of the exciton derived from the fitting was quite large, indicating that it was self-trapped.

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“…On the other hand, for x > 0. 35 (Fig. lob, for x = 0.40) the low energy excitation moves towards higher energy in a well-defined manner.…”

Section: Anisotropy Of Electronic Structure Of the Infinite-layer Commentioning

confidence: 89%

Transmission EELS of oxide superconductors with a cold field emission TEM

Wang

Zhang

Dravid

1995

Microscopy Res & Technique

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Electron energy loss spectrometry (EELS) with a cold field emission gun (cFEG) transmission electron microscope (TEM) is implemented to analyze the evolution of the electronic structure and dielectric function of oxide superconductors. The O-K core loss spectra of p-type doped oxide superconductors are analyzed in terms of holes formation on oxygen sites, while low loss spectra are analyzed for free carrier plasmas, other spectral excitations, and their crystallographic confinement. It is illustrated that the transmission EELS with a cFEG TEM very much complement soft X-ray absorption spectroscopy and optical spectroscopy, with the added advantages of high spatial resolution (approximately 1-100 nm), and is compatible with other analytical, diffraction, and imaging techniques, which are readily available in a cFEG TEM.

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Inelastic electron scattering in amorphous silicon nitride and aluminum oxide with multiple-scattering corrections

Cited by 28 publications

References 16 publications

Determination of Optical Constants by High-Energy, Electron-Energy-Loss Spectroscopy (EELS)

Determination of Optical Constants by High-Energy, Electron-Energy-Loss Spectroscopy (EELS)

Electron energy-loss study of titania particles

Transmission EELS of oxide superconductors with a cold field emission TEM

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