Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films

Han, Fengbo; Zhao, Weihong; Bi, R.; Tian, Feng; Li, Yadan; Zheng, Chuantao; Wang, Yiding

doi:10.3390/ma13010113

Cited by 5 publications

(3 citation statements)

References 45 publications

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“…18,19 A good tradeoff between the electrical conductivity and transparency can be obtained by changing the middle metal layer thickness. 20 It has also been reported that the oxide/metal/oxide structure shows higher thermal stability of conductivity and transparency as compared to the single oxide thin films. 21 Girtan et al 15 investigated the performance of ITO/Ag/ITO and ZnO/Ag/ZnO as electrodes on rigid and flexible substrates and found that the figure of merit varied from 4 × 10 −3 to 29 × 10 −3 Ω −1 with the thickness of the embedded metal film.…”

Section: Introductionmentioning

confidence: 99%

“…The ultrathin continuous metal layer leads to excellent optical transparency along with good conductivity. In addition to protecting the metal layer, the dielectric layer provides high optical transparency in the visible region and reduces metal reflection. , A good tradeoff between the electrical conductivity and transparency can be obtained by changing the middle metal layer thickness . It has also been reported that the oxide/metal/oxide structure shows higher thermal stability of conductivity and transparency as compared to the single oxide thin films .…”

Section: Introductionmentioning

confidence: 99%

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Organic–Inorganic Hybrid Structure as a Conductive and Transparent Layer for Energy and Optoelectronic Applications

Sharma

Singh

et al. 2021

ACS Appl. Electron. Mater.

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In the era of hybrid organic devices, solution-processed metal-embedded polymer multilayer structures are potential candidates for transparent electrode applications. Here, an organic–inorganic–organic (OIO) layered structure has been fabricated as a metal oxide-free transparent conducting electrode, where a thin metal layer (Ag) was sandwiched between two organic polymer (polystyrene) layers. The metal layer was deposited by the DC sputtering technique, and the polymer layers were deposited by an easy and efficient dip coating technique with good thickness control. The thickness of the middle Ag film was varied from 4 to 30 nm to investigate its effect on the transparency and conductivity of the multilayered structure. The morphological behavior shows that a higher thickness of Ag gives a continuous layer formation and a smooth top surface of the layered structure, which is a vital feature of a good electrode. The results of various investigations of the OIO structure show promising optoelectrical performance for its applicability in transparent and flexible optoelectronics. Depth profiling in X-ray photoelectron spectroscopy (XPS) revealed that the Ag layer retains its metallic form mostly and only a small amount gets oxidized when exposed to the environment. In spite of the formation of silver oxide, an electrical resistivity of 1.1 × 10–4 Ω cm with an optical transparency of ∼75% was obtained in the OIO structure for an 8 nm thickness of the Ag layer. The key findings of the present investigations demonstrate a facile, low-cost, and effective method with a rational design for the fabrication and application of a transparent conducting electrode, which can be an alternative to indium tin oxide (ITO).

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Organic–Inorganic Hybrid Structure as a Conductive and Transparent Layer for Energy and Optoelectronic Applications

Sharma

Singh

et al. 2021

ACS Appl. Electron. Mater.

View full text Add to dashboard Cite

show abstract

“…Specially, transparent conductive materials attract much attention due to their wide range of applications such as touch screens [ 1 ], displays [ 2 ], electromagnetic shielding [ 3 ], RF/microwave [ 4 ], glass heaters [ 5 ], solar cells [ 6 ], flexible electronics [ 7 ], OLED [ 8 ] and so on. In both science and engineering, sheet resistance

is widely used to characterize a nanofilm’s electrical conductivity, and it is usually measured using the four-point probe method [ 9 , 10 , 11 , 12 ]. In this method, one major drawback is that good contact should be formed between the probes and the sample under test.…”

Section: Introductionmentioning

confidence: 99%

Contactless Measurement of Sheet Resistance of Nanomaterial Using Waveguide Reflection Method

Tariq

Zhao

et al. 2020

Materials

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Conductive nanomaterials are widely studied and used. The four-point probe method has been widely used to measure nanomaterials’ sheet resistance, denoted as Rs. However, for materials sensitive to contamination or physical damage, contactless measurement is highly recommended if not required. Feasibility of Rs evaluation using a one-port rectangular waveguide working on the microwave band in a contact-free mode is studied. Compared with existed waveguide methods, the proposed method has three advantages: first, by introducing an air gap between the waveguide flange and the sample surface, it is truly contactless; second, within the specified range of Rs, the substrate’s effect may be neglected; third, it does not require a matched load and/or metallization at the sample backside. Both theoretical derivation and simulation showed that the magnitude of the reflection coefficient S11 decreased monotonously with increasing Rs. Through calibration, a quantitative correlation of S11 and Rs was established. Experimental results with various conductive glasses showed that, for Rs in the range of ~10 to 400 Ohm/sq, the estimation error of sheet resistance was below ~20%. The potential effects of air gap size, sample size/location and measurement uncertainty of S11 are discussed. The proposed method is particularly suitable for characterization of conductive glass or related nanomaterials with Rs in the range of tens or hundreds of Ohm/sq.

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The impact of copper and silver as interlayers of zinc telluride films on the physical properties and antifungal efficacy of zinc telluride films

Hasaneen,

Moustafa

2024

Materials Chemistry and Physics

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Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films

Cited by 5 publications

References 45 publications

Organic–Inorganic Hybrid Structure as a Conductive and Transparent Layer for Energy and Optoelectronic Applications

Organic–Inorganic Hybrid Structure as a Conductive and Transparent Layer for Energy and Optoelectronic Applications

Contactless Measurement of Sheet Resistance of Nanomaterial Using Waveguide Reflection Method

The impact of copper and silver as interlayers of zinc telluride films on the physical properties and antifungal efficacy of zinc telluride films

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