2016
DOI: 10.1016/j.optmat.2016.06.008
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Influence of annealing on the linear and nonlinear optical properties of Mn doped ZnO thin films examined by z-scan technique in CW regime

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Cited by 29 publications
(23 citation statements)
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“…37 It is reported that a peak-valley separation (Dx p-v ) more than 1.7 is the apparent validation of thermal nonlinearity. 37,48 The observed nonlinearity has a thermal origin due to energy storage from the laser diode. The difference between the normalized transmittance of the peak and valley (DT p-v ) in the CA measurement is related to n 2 by: 11 DT p-v = 0.406(1 À S) 0.25 n 2 kI 0 L eff (5) where S is the linear transmittance of the aperture (S { 1), Open aperture (OA) z-scan trace was carried out to determine the induced nonlinear absorption (NLA) coefficient b of the samples.…”
Section: Nonlinear Optical Studiesmentioning
confidence: 99%
See 1 more Smart Citation
“…37 It is reported that a peak-valley separation (Dx p-v ) more than 1.7 is the apparent validation of thermal nonlinearity. 37,48 The observed nonlinearity has a thermal origin due to energy storage from the laser diode. The difference between the normalized transmittance of the peak and valley (DT p-v ) in the CA measurement is related to n 2 by: 11 DT p-v = 0.406(1 À S) 0.25 n 2 kI 0 L eff (5) where S is the linear transmittance of the aperture (S { 1), Open aperture (OA) z-scan trace was carried out to determine the induced nonlinear absorption (NLA) coefficient b of the samples.…”
Section: Nonlinear Optical Studiesmentioning
confidence: 99%
“…The sensitivity to NLR is entirely due to the aperture, and the absence of an aperture completely eliminates the self-defocusing effect. 37,38 Fig. 8 illustrates the CA z-scan results and the normalized transmittance (T N ) vs. x. x is a dimensionless variable and is defined as the ratio of the on-axis position (z) to the Rayleigh length z R = kw 0 2 /2.…”
Section: Nonlinear Optical Studiesmentioning
confidence: 99%
“…An ideal optical limiter should possess high linear transmittance, high stability, and a low limiting threshold. [48][49][50][51] Fig. 8 shows optical limiting traces for the pure and yttrium doped CdMoO 4 .…”
Section: Z-scan Analysismentioning
confidence: 99%
“…The effect of different parameters such as annealing temperature, substrate nature, Mn doping concentration on the physical properties of Mn-doped ZnO thin films using different physical and chemical methods of elaboration, such as pulsed laser deposition, [11][12][13] spray pyrolysis, [14,15] magnetron sputtering, [16,17] and sol-gel were widely studied. [18,19] However, very little research investigated the thickness effect of Mn-doped ZnO thin films that used rf magnetron sputtering method for preparation.…”
Section: Introductionmentioning
confidence: 99%