2015
DOI: 10.1016/j.solmat.2015.05.038
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Influence of annealing treatments on solution-processed ZnO film deposited on ITO substrate as electron transport layer for inverted polymer solar cells

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Cited by 34 publications
(22 citation statements)
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“…Indeed, promoting the release of insulating acetate groups from the forming ZnO lm is expected to enhance the electron extraction ability of the ETL by limiting detrimental phenomena such as recombination or trapping of charge carriers. 23,33 Furthermore, the lower leakage current extrapolated from the J-V characteristics in the dark (see Fig. S4 in ESI †) corroborated these considerations, thus conrming the better charge selectivity of PSCs incorporating ZnO-r4 compared to ZnO-r2 and ZnO-r6.…”
Section: Because the [H 2 O]/[zn 2+supporting
confidence: 59%
See 1 more Smart Citation
“…Indeed, promoting the release of insulating acetate groups from the forming ZnO lm is expected to enhance the electron extraction ability of the ETL by limiting detrimental phenomena such as recombination or trapping of charge carriers. 23,33 Furthermore, the lower leakage current extrapolated from the J-V characteristics in the dark (see Fig. S4 in ESI †) corroborated these considerations, thus conrming the better charge selectivity of PSCs incorporating ZnO-r4 compared to ZnO-r2 and ZnO-r6.…”
Section: Because the [H 2 O]/[zn 2+supporting
confidence: 59%
“…32 Despite the key role played by these two interplaying processes in the production of the nal ZnO thin solid lm, their inuence on the functional properties of the resulting PSCs has been surprisingly overlooked. 33 In particular, no examples of systematic approaches to control and ultimately promote the hydrolysis and condensation steps during the formation of ZnO ETLs via sol-gel process have been presented in the literature to date, notwithstanding their potential to further improve PSC device efficiency.…”
Section: Introductionmentioning
confidence: 99%
“…1c, because the conduction band minimum (CBM) of ZnO is close to the energy of the lowest unoccupied molecular orbital (LUMO) of PCBM, electrons can be efficiently transported to the ITO cathode without significant loss. Generally, well-matched energy levels and a favorable contact interface contribute to excellent charge transport properties and overall performance of OSCs [17,18]. In fact, the energy levels and interface between the CBL and the active layer depend on the crystal structure and morphology, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…For instance, according to Park et al, a ZrO x dielectric was synthesized by adding hydrogen peroxide, and the fabricated dielectric film was tested as a TFT, which demonstrated a low leakage current with high breakdown strength (3.4 MV/cm) after film treatment at 350 • C [12]. Lee et al [13] fabricated a solution-processed ZrO x TFT on a glass substrate; however, the desired carrier mobility (~25 cm 2 /Vs) was achieved at a high annealing temperature of 500 • C. Ha and co-workers [14] employed solution-processed ZrO x as a gate dielectric layer of Zinc Tin Oxide (ZTO)-TFTs, which demonstrated a low operating voltage (<5 V) and high channel carrier concentration, but the optimized annealing temperature of the ZrO x dielectric film was as high as 500 • C. Oja et.al [16], Juma et al [17], and Oluwabi et al [18,19] have deposited metal oxide films by spray pyrolysis; in light of their results, the desired morphology and electrical properties were attained after annealing at temperatures above 700 • C. Also, Morvillo et.al [20] reported that annealing does not only influence the performance of metal oxide films but also influences electronic changes in their underlying substrate (e.g. ITO), which eventually makes the optimization process very challenging.…”
Section: Introductionmentioning
confidence: 99%