Influence of Copper and Zinc Doping on Optical Properties of Nano Nickel Oxide Films Deposited by Sol-Gel Method

Kadhm, Ameera J.; Abbas, Israa Akram

doi:10.5101/nbe.v14i4.p360-366

Cited by 2 publications

(1 citation statement)

References 24 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…[10]. TiO 2 is grown using a variety of processes, such as, CVD [11], ion beam [112], PECVD [13], Plasma spray [14],anodic [15], PLD [16], including thermal [17], sol-gel method [18][19][20], RF sputtering method [20,21] and CSP [22][23][24][25]. The major goal of this research was to use the CSP method to produce undoped and TiO 2 :Ag thin films and explore the doping influence on several physical parameters.…”

Section: Introductionmentioning

confidence: 99%

Physical and sensing characterization of nanostructured Ag doped TiO2 thin films

Sada,

Jasim,

Saleh

et al. 2024

JOR

View full text Add to dashboard Cite

On glass substrates, silver (Ag) doped Titanium dioxide (TiO2) films at varied levels of concentrations (0, 2, and 4) % wt were synthesized by chemical spray pyrolysis (CSP). As per the X-ray diffraction pattern, the only phases present in the sample were anatase and rutile TiO2. Using AFM, it was discovered that the TiO2 thin films were smooth and compact; however, the surface roughness increases as the dopant amount decreases. SEM images display TiO2 films. Surface transformation is evident with uniform spherical nanograins after Ag doping. The optical characteristics of wavelength range (300-900) nm have been investigated using absorbance and transmittance spectra. The results revealed that the films have a 65-75 % transmittance in VIS-NIR spectra for all films. The allowable direct electronic transitions have (3.15-3.25) eV energy gaps. At 250 ppm, the NH3 gas sensor exhibited increased resistance, indicating heightened sensitivity. Sensitivity decreases with concentration increases to 0 %, 2 %, and 4 % of Ag for NH3 gas. Reduction observed: 18.4% to 4.6% (50 ppm), 20.7% to 6.8% (150 ppm), and 25.9% to 8.2% (250 ppm).

show abstract

Section: Introductionmentioning

confidence: 99%

Physical and sensing characterization of nanostructured Ag doped TiO2 thin films

Sada,

Jasim,

Saleh

et al. 2024

JOR

View full text Add to dashboard Cite

show abstract

Thickness effects on the physical characterization of nanostructured CuO thin films for hydrogen gas sensor

Hadia,

Jasim,

Chiad

et al. 2024

DJNB

View full text Add to dashboard Cite

In these studies, radio frequency (RF) magnetron sputtering was used to produce nanostructured CuO thin films on glass bases with different thicknesses of (250, 300, and 350 nm). X-ray diffraction (XRD) analysis of these films revealed a polycrystalline structure with a preferred peak along the (111) plane. The Scherrer formula was used to compute the grain size. It was found that the average grain sizes are 10.78 nm, 11.36 nm, and 11.84 nm for film thicknesses of 250, 3000, and 300 nm, respectively, while the dislocation density and strain values decline. The surface roughness decreased from 9.30 nm to 4.71 nm as the thickness increased, according to atomic force microscopy (AFM) data. As the thickness of the film grew, the root mean square (RMS) roughness likewise decreased from 9.18 nm to 4.29 nm. The homogenous, semi-spherical structure comprises uniformly distributed particles, as demonstrated by SEM images. The optical properties of the grown films showed that the absorption coefficient considerably increased with film thickness. Transmittance, band gap, refractive index, and extinction coefficient all decrease with increasing film thickness. The hydrogen gas measurements, indicated a reduction in sensitivity as the thickness and gas concentration increased at 30°C.

show abstract

Influence of Copper and Zinc Doping on Optical Properties of Nano Nickel Oxide Films Deposited by Sol-Gel Method

Cited by 2 publications

References 24 publications

Physical and sensing characterization of nanostructured Ag doped TiO2 thin films

Physical and sensing characterization of nanostructured Ag doped TiO2 thin films

Thickness effects on the physical characterization of nanostructured CuO thin films for hydrogen gas sensor

Contact Info

Product

Resources

About