Influence of crystal orientation on stretching induced void formation in poly(4‐methyl‐1‐pentene) investigated by in‐situ small‐angle and wide‐angle
            <scp>X‐</scp>
            ray scattering

Yang, Qingqing; Liu, Xiang; Shi, Hengchong; Zou, Lin; Cheng, Kaichang; Li, Taolin; Chang, Baobao; Liu, Chuntai; Shen, Changyu

doi:10.1002/pcr2.10215

Polymer Crystallization

2021

DOI: 10.1002/pcr2.10215

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Influence of crystal orientation on stretching induced void formation in poly(4‐methyl‐1‐pentene) investigated by in‐situ small‐angle and wide‐angle X‐ ray scattering

Qingqing Yang

Xiang Liu

Hengchong Shi

et al.

Abstract: In this work, the void formation of poly(4-methyl-1-pentene) (P4MP1) during solid-state stretching was investigated by in-situ small-angle and wide-angle X-ray scattering. By controlling the heating temperature, P4MP1 specimens with different orientation degrees were obtained. The results showed that: (1) specimens with high

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2024

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Cavitation behavior of poly(4‐methyl‐1‐pentene)/polypropylene/poly(4‐methyl‐1‐pentene) tri‐layer film: Influence of annealing and stretching temperature

Shi,

Chang

et al. 2024

J of Applied Polymer Sci

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In this work, poly(4‐methyl‐1‐pentene)/polypropylene/poly(4‐methyl‐1‐pentene) tri‐layer films were prepared. The microstructure of the film was adjusted by annealing in the temperature range of 150–237.5°C. Afterward, the influence of annealing and stretching temperature on the cavitation behavior of the film was investigated by small‐angle x‐ray scattering (SAXS). Results showed that for the “butterfly” scattering in the early stage, the radius of gyration () and maximum dimension () of voids were ca. 75 and 200 nm, which were hardly influenced by annealing. Whereas, the volume fraction of voids was enlarged obviously, suggesting that more voids were formed; for the “streak” scattering in the late stage, the length of voids () grew gradually with stretching, and the ultimate value of was 432.5 nm for un‐annealed film and 176 nm for film annealed at 230°C. Simultaneously, the misorientation of voids was reduced from 0.33 to 0.18. As the stretching temperature was elevated from 30 to 45 and 60°C, and maintained at 75 and 200 nm, and was enlarged to 434 and 432 nm. At the same time, the number of voids was reduced obviously. As the stretching temperature was 90°C, the voids were suppressed.

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Cavitation behavior of poly(4‐methyl‐1‐pentene)/polypropylene/poly(4‐methyl‐1‐pentene) tri‐layer film: Influence of annealing and stretching temperature

Shi,

Chang

et al. 2024

J of Applied Polymer Sci

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Influence of crystal orientation on stretching induced void formation in poly(4‐methyl‐1‐pentene) investigated by in‐situ small‐angle and wide‐angle X‐ ray scattering

Cited by 1 publication

References 70 publications

Cavitation behavior of poly(4‐methyl‐1‐pentene)/polypropylene/poly(4‐methyl‐1‐pentene) tri‐layer film: Influence of annealing and stretching temperature

Cavitation behavior of poly(4‐methyl‐1‐pentene)/polypropylene/poly(4‐methyl‐1‐pentene) tri‐layer film: Influence of annealing and stretching temperature

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