2015
DOI: 10.4236/jmp.2015.62023
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Influence of Deformation on CVC p-n-Junction in a Strong Microwave Field

Abstract: This paper investigates the current-voltage characteristics (CVC) strain of p-n-junction in a strong microwave (MW) field and shows that the deformation increases the current generated in the p-njunction. We analyze the current-voltage characteristics of p-n-junction in which three-dimensional space (I,U,ε) gives more complete information than the two-dimensional.

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Cited by 5 publications
(2 citation statements)
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“…The total current passing through the diode consists of electron and hole currents [11,12] (6) This shows that the Frenkel mechanism also influences the volt-ampere characteristic of the pn junction.…”
Section: Study Of the Influence Of The Perturbation Of The Heightmentioning
confidence: 99%
“…The total current passing through the diode consists of electron and hole currents [11,12] (6) This shows that the Frenkel mechanism also influences the volt-ampere characteristic of the pn junction.…”
Section: Study Of the Influence Of The Perturbation Of The Heightmentioning
confidence: 99%
“…It is shown that the barrier height of p-n-junction in a strong microwave field, reducing the barrier illuminated p-n-junction, is proportional to the height of the initial barrier, if the latter is reduced by direct displacement. In [6] the current-voltage characteristic (CVC) of strained p-n-junction in a microwave field is investigated and it has been showed that the deformation increases the current generated in the p-n-junction.…”
Section: Introductionmentioning
confidence: 99%