2010 Photonics Global Conference 2010
DOI: 10.1109/pgc.2010.5706061
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Influence of device structures on carrier recombination in GaAsSb/GaAs QW lasers

Abstract: Abstract-We investigate the temperature and pressure dependence of carrier recombination processes occurring in various GaAsSb/GaAs QW laser structures grown under similar growth conditions. Thermally activated carrier leakage via defects is found to be very sensitive to the strain induced interface imperfections. Nonradiative recombination is found to be sensitive to the number of QWs. A strain compensated MQW structure leads to a reduced contribution of nonradiative recombination to the threshold current den… Show more

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Cited by 2 publications
(3 citation statements)
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“…Two ternary material systems that have been extensively investigated in thin-film devices operating at these wavelengths are GaAsSb [1][2][3] and InGaAs [4,5]. The GaAsSb (III-V-V) system offers distinct advantages over InGaAs (III-III-V) due to (a) suppressed Auger recombination, (b) longer electron lifetime, and (c) less dependency of the electronic structure on its alloy configuration due to the presence of a single group III element [6].…”
Section: Introductionmentioning
confidence: 99%
“…Two ternary material systems that have been extensively investigated in thin-film devices operating at these wavelengths are GaAsSb [1][2][3] and InGaAs [4,5]. The GaAsSb (III-V-V) system offers distinct advantages over InGaAs (III-III-V) due to (a) suppressed Auger recombination, (b) longer electron lifetime, and (c) less dependency of the electronic structure on its alloy configuration due to the presence of a single group III element [6].…”
Section: Introductionmentioning
confidence: 99%
“…[11][12][13] However, the optimization of the growth conditions to grow highquality GaAs 1Àx Sb x /GaAs (x ¼ 0.3 necessary for $1.3 lm emission) QW active material is one of the major challenges to make this material system commercially viable. [14][15][16] The aim of this letter is to compare device characteristics of GaAs 1Àx Sb x /GaAs QW lasers to aid in the design and optimization of GaAsSb/GaAs-based edge-emitting lasers and VCSELs.…”
mentioning
confidence: 99%
“…J th for devices A and B increase by $27% and $44%, respectively, up to 7 kbar at RT suggesting the presence of carrier leakage in these devices as observed earlier in similar devices. 1,15,16 The lower rate of increase in J th with pressure in device A compared to device B may be due to the higher growth temperature of device A, which increases Sb segregation and thus the concentration of defects. The fact that J th for device A has a stronger temperature dependence but weaker pressure dependence indicates the presence of defects which are shallow and therefore not pressure dependent.…”
mentioning
confidence: 99%