2020
DOI: 10.1016/j.apsusc.2020.145430
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Influence of different metal concentrations on the morphology of Ag–As2Ch3 thin films analyzed by Rutherford Backscattering Spectrometry and Energy Dispersive Spectroscopy

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Cited by 2 publications
(2 citation statements)
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“…Rutherford backscattering spectrometry (RBS) is a highly effective technique for elemental analysis and depth analysis technique of surface layers and thin films of solids, especially for the analysis of heavy elements on light elemental matrices. [7][8][9]. This non-destructive testing method is simple to perform and widely used for determining the thickness of thin films and the relative content of matrix elements.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Rutherford backscattering spectrometry (RBS) is a highly effective technique for elemental analysis and depth analysis technique of surface layers and thin films of solids, especially for the analysis of heavy elements on light elemental matrices. [7][8][9]. This non-destructive testing method is simple to perform and widely used for determining the thickness of thin films and the relative content of matrix elements.…”
Section: Resultsmentioning
confidence: 99%
“…If the total amount of incoming diffusion material is equal to the increase of diffusion material in the cell, equation ( 8) is obtained from equations ( 4), ( 5), (6), and (7).…”
Section: = −mentioning
confidence: 99%