2006
DOI: 10.1016/j.physb.2005.12.184
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Influence of gas atmosphere during growth interruption in the deposition of ZnO films by magnetron sputtering

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Cited by 9 publications
(8 citation statements)
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“…These results corroborated the findings of the XRD and XPS investigations. Nonetheless, the Al-doped ZnO films did show a slightly coarse natured surface, which can be attributed to the coalescence of the grain boundaries, as previously reported in the case of Al-doped ZnO films deposited via sputtering [12]. Moreover, the optical properties of the as-prepared doped and undoped ZnO-based nanostructures were investigated via UV-Vis spectroscopy.…”
Section: Resultssupporting
confidence: 63%
See 2 more Smart Citations
“…These results corroborated the findings of the XRD and XPS investigations. Nonetheless, the Al-doped ZnO films did show a slightly coarse natured surface, which can be attributed to the coalescence of the grain boundaries, as previously reported in the case of Al-doped ZnO films deposited via sputtering [12]. Moreover, the optical properties of the as-prepared doped and undoped ZnO-based nanostructures were investigated via UV-Vis spectroscopy.…”
Section: Resultssupporting
confidence: 63%
“…These results corroborated the findings of the XRD and XPS investigations. Nonetheless, the Al-doped ZnO films did show a slightly coarse natured surface, which can be attributed to the coalescence of the grain boundaries, as previously reported in the case of Al-doped ZnO films deposited via sputtering [12]. The surface morphologies of the as-developed pure ZnO, Al-ZnO, and Cu-ZnO thin films were examined using scanning electron microscopic (SEM) studies, and the acquired images are shown in Figure 4.…”
Section: Resultssupporting
confidence: 63%
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“…Next, the ZnO layer was deposited at a higher temperature on the buffer layer to obtain a high-quality thin film. Reports [ 17 , 18 , 19 ] have shown that there is marked improvement in both the optical properties and crystalline quality achieved through a two-step growth using the RF magnetron sputtering system.…”
Section: Methodsmentioning
confidence: 99%
“…This amorphous SiO x layer degrades the crystal quality of ZnO grown on the Si substrate. To obtain high-quality ZnO thin films grown on Si substrates, several studies have been reported the influence of buffer layers by various methods and processes [1,[12][13][14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%