2017
DOI: 10.1016/j.spmi.2016.11.039
|View full text |Cite
|
Sign up to set email alerts
|

Influence of Germanium source on dopingless tunnel-FET for improved analog/RF performance

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

0
11
0

Year Published

2017
2017
2024
2024

Publication Types

Select...
9
1

Relationship

0
10

Authors

Journals

citations
Cited by 28 publications
(11 citation statements)
references
References 15 publications
0
11
0
Order By: Relevance
“…The HTFET can effectively decrease the tunneling barrier width, thereby increasing the band tunneling efficiency. UTFET mainly use the embedded channel to obtain the larger line tunneling area to increase the on-state current [16]. The DLTFET can solve the heavily doped technology problem.…”
Section: Introductionmentioning
confidence: 99%
“…The HTFET can effectively decrease the tunneling barrier width, thereby increasing the band tunneling efficiency. UTFET mainly use the embedded channel to obtain the larger line tunneling area to increase the on-state current [16]. The DLTFET can solve the heavily doped technology problem.…”
Section: Introductionmentioning
confidence: 99%
“…To improve the analog/radio frequency (RF) performance and simplify the fabrication processes of TFETs, a doping-less tunnel field-effect transistor (DLTFET) is proposed [18,19]. A DLTFET can form heavily doped source and drain regions using the appropriate metal electrode work functions.…”
Section: Introductionmentioning
confidence: 99%
“…Different from the MOSFETs, the working mechanism of tunneling field effect transistors (TFETs) is based on the quantum effect of electron Band-To-Band Tunneling (BTBT). The TFETs have the lower off-state leakage current, higher robustness of the short channel effect and faster switching speed, which is compatible with CMOS processes [10,11]. The TFET can break the SS limit of 60 mV/Dec, which can obtain the better device performance and lower static power consumption under the lower voltage operating conditions [12].…”
Section: Introductionmentioning
confidence: 99%