2007
DOI: 10.1016/j.jcrysgro.2006.11.074
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Influence of interface interruption on spin relaxation in GaAs (110) quantum wells

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Cited by 8 publications
(3 citation statements)
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“…Hence, they are mainly used for probing information about the spin dynamics of charge carriers in materials. 118,119 TRFR and TRKR techniques involve two ultra-short laser pulses. The first consists of a circularly polarized pump laser pulse and the second involves a linearly polarized probe pulse.…”
Section: Characterization Techniques For Defect Passivationmentioning
confidence: 99%
“…Hence, they are mainly used for probing information about the spin dynamics of charge carriers in materials. 118,119 TRFR and TRKR techniques involve two ultra-short laser pulses. The first consists of a circularly polarized pump laser pulse and the second involves a linearly polarized probe pulse.…”
Section: Characterization Techniques For Defect Passivationmentioning
confidence: 99%
“…5,23 Although the DP mechanism is ideally suppressed in (110) QWs, 12 a random built-in asymmetry in QWs resulting from alloy fluctuations or an interface roughness between the QWs and barrier layers may lead to in-plane components of B SIA that induce DP spin relaxation. [24][25][26] Thus, we cannot determine the origin of shortening of the T s in an electric field at this moment.…”
mentioning
confidence: 95%
“…Regarding (2), it is considered that improvement of hetero-interface morphology may increase spin relaxation time due to the suppression of the DP process through decrease of the SIA term [4]. Recently, increase of spin relaxation time in (110)-oriented GaAs/AlGaAs QWs grown with interface growth interruption (GI) was reported [5]. However, effect of growth interruption on electron spin relaxation was not fully understood.…”
mentioning
confidence: 99%