IntroductionRecently, in semiconductors, spin devices such as spin-FET and -LED become a focus of interest. Spin dynamics has to be characterized in order to realize the spin devices. One of the significant factors in spin dynamics is electron spin relaxation time. Long spin relaxation time is beneficial for the manipulation of the spin states of electrons. In order to obtain long spin relaxation time, it is necessary to understand spin relaxation mechanisms in detail. It is well known that the dominant spin relaxation mechanism at room temperature in zinc blende semiconductors such as GaAs is D'yakonov-Perel' (DP) mechanism [1, 2]. In the DP process, electron spin relaxation in GaAs/AlGaAs quantum wells (QWs) derives from two types of inversion asymmetry: (1) the bulk inversion asymmetry (BIA) and (2) the structural inversion asymmetry (SIA). Regarding (1), H. Ohno et al. demonstrated dramatically long spin relaxation time in (110)-oriented GaAs/AlGaAs QWs due to the suppression of the DP process through decrease of the BIA term [3]. Regarding (2), it is considered that improvement of hetero-interface morphology may increase spin relaxation time due to the suppression of the DP process through decrease of the SIA term [4]. Recently, increase of spin relaxation time in (110)-oriented GaAs/AlGaAs QWs grown with interface growth interruption (GI) was reported [5]. However, effect of growth interruption on electron spin relaxation was not fully understood. Then, in order to investigate correlation between the hetero-interface roughness and electron spin relaxation time, we fabricated GaAs/AlGaAs QWs on GaAs (110) substrates using molecular beam epitaxy (MBE) with interface growth interruption and evaluated electron spin relaxation time in (110) QWs.