2002
DOI: 10.1016/s0921-5093(01)01820-2
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Influence of intermetallic compounds on the adhesive strength of solder joints

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Cited by 112 publications
(50 citation statements)
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“…The EDS analysis indicated that the inner layer (A) adjacent to the Cu substrate is Cu 3 Sn and the outer layer (B) is Cu 6 Sn 5 , whereas only Cu 6 Sn 5 is observed in 3 Sn layer was observed after aging for 144 h at 150°C. The Cu 3 Sn was not observed at 120°C until after 500 h, and it never appeared at 105°C even after aging for 500 h. Previous studies 3,4,7,8 proclaimed that the formation of Cu 3 Sn was inhibited because of the prevention of Sn diffusion through the Cu 6 Sn 5 layer, which forms at reflow. Previous studies also reported that the growth activation energy of Cu 3 Sn is greater than that of Cu 6 Sn 5 .…”
Section: Growth Kinetics Of the Interfacial Intermetallic Compound Upmentioning
confidence: 89%
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“…The EDS analysis indicated that the inner layer (A) adjacent to the Cu substrate is Cu 3 Sn and the outer layer (B) is Cu 6 Sn 5 , whereas only Cu 6 Sn 5 is observed in 3 Sn layer was observed after aging for 144 h at 150°C. The Cu 3 Sn was not observed at 120°C until after 500 h, and it never appeared at 105°C even after aging for 500 h. Previous studies 3,4,7,8 proclaimed that the formation of Cu 3 Sn was inhibited because of the prevention of Sn diffusion through the Cu 6 Sn 5 layer, which forms at reflow. Previous studies also reported that the growth activation energy of Cu 3 Sn is greater than that of Cu 6 Sn 5 .…”
Section: Growth Kinetics Of the Interfacial Intermetallic Compound Upmentioning
confidence: 89%
“…7,8 The relationship between the thickness of the IMC layer and aging time is generally described as 9…”
Section: Introductionmentioning
confidence: 99%
“…Thus available data on bulk materials are not reliable if one considers the extremely small solder volumes (<10 -12 m 3 ) in modern microelectronic devices. Several investigations have been conducted on the thermomechanical integrity and reliability of solder joints, also with respect to specimen size, 2-4 the influence of rather brittle intermetallic compounds (IMCs) (such as Cu 3 Sn and Cu 6 Sn 5 ), on the strength 5,6 or the tensile fracture of solder joints 7 as well as deformation characteristics of solder joints during shear loading. 8 Nevertheless, very few systematic experimental studies on the effect of the reduced solder size and geometry on the mechanical performance are available in the literature.…”
Section: Introductionmentioning
confidence: 99%
“…While all these methods can join dissimilar metals, metals in general form poor welds at low soldering temperatures. [18][19][20][21] Nevertheless, little has been done on the relationship between detection sensitivity of these gyroscopes and assembly methods and conditions.…”
Section: Introductionmentioning
confidence: 99%