Influence of ion energy and ion species on ion channeling in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mtext>LiNbO</mml:mtext></mml:mrow><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math>

Steinbach, Tobias; Schrempel, Frank; Gischkat, Th.; Wesch, W.

doi:10.1103/physrevb.78.184106

Cited by 7 publications

(3 citation statements)

References 40 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The defect formation by Si + ion irradiation of LN along crystallographic directions has been investigated by Schrempel et al [126,127]. For the case of low ion energies (<1 MeV for Si + ) it was observed that the nuclear damage maxima were shifted to higher depth for aligned irradiation with respect to those of random incidence.…”

Section: Electronic Damage Dominated Casesmentioning

confidence: 99%

Unveiling the Defect Structure of Lithium Niobate with Nuclear Methods

Kling

Marques

2021

Crystals

View full text Add to dashboard Cite

X-ray and neutron diffraction studies succeeded in the 1960s to determine the principal structural properties of congruent lithium niobate. However, the nature of the intrinsic defects related to the non-stoichiometry of this material remained an object of controversial discussion. In addition, the incorporation mechanism for dopants in the crystal lattice, showing a solubility range from about 0.1 mol% for rare earths to 9 mol% for some elements (e.g., Ti and Mg), stayed unresolved. Various different models for the formation of these defect structures were developed and required experimental verification. In this paper, we review the outstanding role of nuclear physics based methods in the process of unveiling the kind of intrinsic defects formed in congruent lithium niobate and the rules governing the incorporation of dopants. Complementary results in the isostructural compound lithium tantalate are reviewed for the case of the ferroelectric-paraelectric phase transition. We focus especially on the use of ion beam analysis under channeling conditions for the direct determination of dopant lattice sites and intrinsic defects and on Perturbed Angular Correlation measurements probing the local environment of dopants in the host lattice yielding independent and complementary information.

show abstract

Section: Electronic Damage Dominated Casesmentioning

confidence: 99%

Unveiling the Defect Structure of Lithium Niobate with Nuclear Methods

Kling

Marques

2021

Crystals

View full text Add to dashboard Cite

show abstract

“…For example, it is generally accepted that electronic excitations in quartz can result in exciton self-trapping that can lead to structural changes upon their annihilation [ 1 , 4 , 5 ]. While the process causing damage is not clear (nuclear stopping power or self-trapped exciton mechanism), we show in Figure 2 c,d that the presented in situ RBS/c set-up enables detailed measurements of the channeling and near-channeling effects influencing ion track formation [ 22 , 49 , 50 ].…”

Section: Experiments and Resultsmentioning

confidence: 99%

“…While the process causing damage is not clear (nuclear stopping power or self-trapped exciton mechanism), we show in Figs. 2c,d that presented in situ RBS/c set-up will enable detailed measurements of the channeling and near-channeling effects influencing ion track formation [MT09], [TS08], [MK17b].…”

Section: Monitoring Ion Track Production In Quartz Sio2 By In Situ Rbs/cmentioning

confidence: 99%

Monitoring Ion Track Formation Using In Situ RBS/c, ToF-ERDA, and HR-PIXE

et al. 2017

View full text Add to dashboard Cite

Abstract:The aim of this work is to investigate the feasibility of ion beam analysis techniques for monitoring swift heavy ion track formation. First, the use of the in situ Rutherford backscattering spectrometry in channeling mode to observe damage build-up in quartz SiO 2 after MeV heavy ion irradiation is demonstrated. Second, new results of the in situ grazing incidence time-of-flight elastic recoil detection analysis used for monitoring the surface elemental composition during ion tracks formation in various materials are presented. Ion tracks were found on SrTiO 3 , quartz SiO 2 , a-SiO 2 , and muscovite mica surfaces by atomic force microscopy, but in contrast to our previous studies on GaN and TiO 2 , surface stoichiometry remained unchanged. Third, the usability of high resolution particle induced X-ray spectroscopy for observation of electronic dynamics during early stages of ion track formation is shown.

show abstract