2008
DOI: 10.1002/pssc.200779505
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Influence of laser crystallization on hydrogen bonding in poly‐Si

Abstract: We investigate the influence of the hydrogen content in the amorphous starting material on hydrogen bonding and defect passivation in laser crystallized poly‐Si using electron‐spin‐resonance and hydrogen effusion measurements. After laser dehydrogenation and crystallization the specimens contain a residual H concentration of 8×1021 cm–3 to 1.5×1022 cm–3. During a vacuum anneal at least 1.5×1021 cm–3 H atoms are mobile in the lattice, however, only about 3.7×1018 cm–3 H atoms passivate Si dangling‐bonds. Our re… Show more

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