2016
DOI: 10.1088/0268-1242/31/5/055006
|View full text |Cite
|
Sign up to set email alerts
|

Influence of oxygen incorporation on the defect structure of GaN microrods and nanowires. An XPS and CL study

Abstract: We report a cathodoluminescence (CL) and x-ray photoelectron spectroscopy (XPS) study of the influence of oxygen incorporation on the defect structure of GaN microrods and nanowires. The micro-and nanostructures were synthesized by a thermal evaporation method, which enables us to incorporate oxygen at different concentrations by varying the growth temperature. HR-TEM measurements revealed that oxygen generates stacking fault defects and edge dislocations along the GaN nanowires. Amorphous GaO x N y compounds … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

2
12
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 21 publications
(14 citation statements)
references
References 43 publications
2
12
0
Order By: Relevance
“…In addition, Ga-O bond peak centered at 530.5 eV in O1s core level spectra further provided that the nature of GaN NCs involved oxygen elements, as illustrated in Fig. 4(c) 28 .…”
Section: Resultsmentioning
confidence: 80%
“…In addition, Ga-O bond peak centered at 530.5 eV in O1s core level spectra further provided that the nature of GaN NCs involved oxygen elements, as illustrated in Fig. 4(c) 28 .…”
Section: Resultsmentioning
confidence: 80%
“…Figure (c) and (d) shows the deconvoluted XPS spectra of the O 1s and N 1s signals, respectively. In Figure (c), the component of 530 eV corresponds to the ZnO bonds, the component of 531 eV correspond to CO bonds and the component of 532 eV to single bonded oxygen atoms with different hydrocarbon molecules . Figure (d) revealed two components for the N 1s signal centered at 397 and 400 eV that corresponds to the Zn‐N bond, and to terminally bonded well screened molecular nitrogen, respectively …”
Section: Resultsmentioning
confidence: 95%
“…We had previously identified these line defects as edge dislocations 31 generated by atomic stacking faults (planar defects 32 ) that promote the incorporation of oxygen into the GaN lattice at high concentrations. 19 HRTEM images obtained near the end of one of these nanowires show atomic planes spaced by approximately 5 Å corresponding to the wurtzite (0001) planes [inset in Fig. 5(b)].…”
Section: Resultsmentioning
confidence: 99%
“…The non-magnetic nichrome Ni 0.8 Cr 0.2 buffer layer deposited by thermal evaporation onto Si(100) allowed optimal adherence of the GaN structures with the substrates. As shown in Table I, four samples were synthesized at temperatures and growth times in accordance with previous studies, 18,19 using NH 3 (Infra 99.9%) as carrier gas at flows between 12 and 16 sccm. The powder mix was placed in an alumina boat at the center of the furnace, evaporated at 1200 C, and diffused upstream of the ammonia flow toward four aligned NiCr/Si(100) substrates along the quartz tube.…”
Section: Introductionmentioning
confidence: 99%