2015
DOI: 10.1016/j.jnucmat.2014.11.045
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Influence of plasma impurities on the deuterium retention in tungsten exposed in the linear plasma generator PSI-2

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Cited by 35 publications
(25 citation statements)
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“…In addition, a Thomson scattering system for n e , T e measurements is under construction, which has an advantage of no moving parts inside the vacuum chamber. Optical emission spectroscopy is used for the characterization of the main plasma, 5,6 impurity ion concentration [7][8][9] and in-situ characterization of the PMI processes such as erosion from the target. 10 An in-situ quartz microbalance system is used to measure the amount of the re-deposition of material sputtered from the sample surface.…”
Section: Layout Diagnostics and Plasma Parameters Of Psi-2mentioning
confidence: 99%
“…In addition, a Thomson scattering system for n e , T e measurements is under construction, which has an advantage of no moving parts inside the vacuum chamber. Optical emission spectroscopy is used for the characterization of the main plasma, 5,6 impurity ion concentration [7][8][9] and in-situ characterization of the PMI processes such as erosion from the target. 10 An in-situ quartz microbalance system is used to measure the amount of the re-deposition of material sputtered from the sample surface.…”
Section: Layout Diagnostics and Plasma Parameters Of Psi-2mentioning
confidence: 99%
“…The multiply charged ions can obtain a relatively high energy when they travel through the plasma sheath and reach the W surface. However, different impurity ions can also change the material microstructure and change retention 31 . In this study, Raman spectroscopy and energy disperse spectroscopy (EDS) have been used to detect the surface microstructures and compositions of polycrystalline tungsten irradiated, and no impurities, such as C and O were found to exist on the W surface.…”
Section: Resultsmentioning
confidence: 99%
“…For He the picture is more complex. According to [43,44,45] He pre-or co-implantation with HIs reduces the uptake and permeation of HIs for which two explanations are suggested in literature: Either the He containing surface layer that forms, reduces the solute diffusion coefficient, similar to what has been shown for nitrides or carbides, or He nano-bubbles form and result in connected porosity to the surface thus increasing out-gassing, similar to HI-induced blisters as described in section 3. In order to disentangle the two processes the He containing layer was moved into the bulk by high energy (MeV) He implantation in [46] .…”
Section: Influence Of Impurities On Transport and Trappingmentioning
confidence: 89%