2004
DOI: 10.1016/j.materresbull.2004.03.008
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Influence of pressure and annealing on the microstructural and electro-optical properties of RF magnetron sputtered ITO thin films

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Cited by 64 publications
(28 citation statements)
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“…The few exceptions include Sychkova et al [24], who reported both optical and electrical properties of 9-80 nm ITO films deposited by pulsed DC sputtering varied with thickness and showed a general increase in resistivity with decrease in film thickness [24]. Other notable studies on ultra-thin ITO films using various deposition techniques include the following: Chen et al who used filtered cathodic vacuum arc (FCVA) to deposit 30-50 nm on heated quartz and Si substrates [25]; Tseng and Lo, who used DC magnetron sputter for 34.71-71.64 nm ITO film on PET (polyethylene terephthalate) [26]; Kim et al who used RF magnetron sputter for films between 40 and 280 nm deposited on PMMA substrate heated at 70°C [27]; Alam and Cameron, who used sol-gel process for 50-250 nm film deposited on titanium dioxide film [20]; and Betz et al who used planar DC magnetron sputtering for 50, 100 and 300 nm films on glass substrates [28]. The results from these few thin TCO studies reveal a pattern in which resistivity increases rapidly as film thickness decreases from 50 to 10 nm.…”
Section: Introductionmentioning
confidence: 99%
“…The few exceptions include Sychkova et al [24], who reported both optical and electrical properties of 9-80 nm ITO films deposited by pulsed DC sputtering varied with thickness and showed a general increase in resistivity with decrease in film thickness [24]. Other notable studies on ultra-thin ITO films using various deposition techniques include the following: Chen et al who used filtered cathodic vacuum arc (FCVA) to deposit 30-50 nm on heated quartz and Si substrates [25]; Tseng and Lo, who used DC magnetron sputter for 34.71-71.64 nm ITO film on PET (polyethylene terephthalate) [26]; Kim et al who used RF magnetron sputter for films between 40 and 280 nm deposited on PMMA substrate heated at 70°C [27]; Alam and Cameron, who used sol-gel process for 50-250 nm film deposited on titanium dioxide film [20]; and Betz et al who used planar DC magnetron sputtering for 50, 100 and 300 nm films on glass substrates [28]. The results from these few thin TCO studies reveal a pattern in which resistivity increases rapidly as film thickness decreases from 50 to 10 nm.…”
Section: Introductionmentioning
confidence: 99%
“…Como eletrodos de trabalho, foram utilizados substratos de vidro sodalime, de 1x1 pol 2 , cobertos com dois tipos de filmes condutores: óxido de índio-estanho (ITO), depositados por pulverização catódica [18], e óxido de estanho dopado com flúor (SnO 2 :F), adquiridos da empresa Flexitec. Ambos os substratos possuíam resistência de folha na faixa de 10-20 Ω/ .…”
Section: A Célula Eletroquímica E Eletrodosunclassified
“…Generally, a transparent electromagnetic wave shielding material is required to have the shielding capacity above 20db, and the optical transmissivity above 60% within the visible spectrum (380~780 nm). [7][8][9] ITO exhibits an optical transmissivity above 80% and excellent electrical conductivity. Consequently, research activities related to the manufacture of ITO film and its property enhancement are being conducted actively.…”
Section: Introductionmentioning
confidence: 99%
“…Consequently, research activities related to the manufacture of ITO film and its property enhancement are being conducted actively. [7][8][9] However, there hasn't been too much research effort regarding the mass production of indium oxide powder 10) and tin oxide powder with average particle size below 50 nm and uniform particle size distribution. In particular, there has been hardly any research activity related to the manufacture of nano-size tin oxide powder due to the engineering difficulties.…”
Section: Introductionmentioning
confidence: 99%