Influence of Satellite Retroreflector Precision on Far-Field Diffraction Pattern

Hui, 周辉 Zhou; Song, 李松 Li; Guoxing, 郑国兴 Zheng; Junling, 高俊玲 Gao

doi:10.3788/aos20092901.0060

Cited by 6 publications

(2 citation statements)

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“…According to the six reflection sequences described above, taking into account the dihedral angle error δ 12 , δ 23 and δ 31 , via the vector form reflection law, six reflection patterns can be expressed as [8]: 12 13 1 12 23 2 13 23 3 Combining Eq. (1) and Eq.…”

Section: Relation Between Dihedral Angle Error and Wavefront Phase DImentioning

confidence: 99%

Establishment and study on dihedral angle detection model of retro-reflector based on Zygo interferometer

Feng

Zhong

et al. 2010

SPIE Proceedings

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The dihedral angle of a retroreflector, which directly determines the quality of velocity aberration compensation, is usually detected using a Zygo interferometer. However, since the software is effectively a black box, the user is unable to determine the method and approach that is used to process the data. This also adds further difficulty of determining the error inherent in the retroreflector. From the perspective of phase distribution, a mathematical model is built between rectangular error and phase distribution. Combining the original data and area boundaries provided by Zygo interferometer, and a numerical fitting method, the dihedral angle value of the retroreflector is computed, and then compared with the value provided by the interferometer. Results show that the maximum difference between the two values is 0.2". Considering that the measurement tolerance of the Zygo interferometer is 0.2", this suggests that the computed value is consistent with the value given by the interferometer. Thus, computing method provides a new basis and approach for dihedral angle detection for retroreflector manufacturers and users.

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Section: Relation Between Dihedral Angle Error and Wavefront Phase DImentioning

confidence: 99%

Establishment and study on dihedral angle detection model of retro-reflector based on Zygo interferometer

Feng

Zhong

et al. 2010

SPIE Proceedings

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“…因此, 在反射器设计中, 准确的角锥棱镜远场衍射图样(far field diffraction pattern, FFDP) 仿真计算对于优化反射器的雷达散射截面具有重要的指导意义, 已成为评价反射器性能的重要分析手段. 国内外学者已在该领域做了大量的研究工作, Chang等 [9] 在 1971年就开展了无镀膜角锥棱镜的远场衍射研究; Arnold [2,10] 也较早开展了角锥棱镜光学特性的研究, 完成了角锥棱镜在多种参数下的远场衍射分析; Otsubo等 [11] 在对激光测月反射器的研究中分析计算了不同镀膜类型和不同口径的角锥棱镜远场衍射图样; Sadovnikov和Sokolov [3] 建立了完整的无镀膜角锥棱镜的完全内反射偏振态转化模型, 得到了经实验验证的无镀膜角锥棱镜远场衍射; 声远 [4,12] 、钟声远等 [13] 和周辉等 [5,6,14] 从多个角度在数学上描述了角锥棱镜的FFDP计算原理, 给出…”

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Far-field diffraction pattern of cube corner retroreflector at oblique incidence

Tang,

Cheng,

Deng

et al. 2021

Acta Phys. Sin.

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<sec>Corner cube retroreflector (CCR) as a main optical component of laser ranging retroreflector array plays a key role in satellite laser ranging (SLR) to cooperative targets. To accurately estimate the echo energy of SLR, it is necessary to precompute photons’ distribution in the distance of SLR station by calculating the Far field diffraction pattern (FFDP) of CCR under various conditions. In this paper, the analysis of the effective reflection area and optical reflectivity of CCR for arbitrary incidence angle are carried out, in which a method to calculate the CCR effective reflection area with a wider applicability is used, and the difference between optical reflectivity of metal-coated CCR and uncoated (total internal reflection) CCR is also discussed. On this basis, combined with optical diffraction theory, a simulation program for CCR FFDP calculation is established, thereby producing FFDPs of CCR for a variety of incidence angles under different coating conditions. The results show that the FFDP of metal-coated CCR is almost unrelated to the azimuth angle of incident light or polarization, but is determined only by elevation angle of incident light. The pattern is always like Airy spot or its tensile deformation. Relatively, uncoated CCR’s FFDP has a more complex figure, its reflected energy is divided into several lobes whose size, number and position are all influenced by elevation and azimuth angle of incidence, and also by the polarization. Generally, the incidence direction which has a large total intensity of far optical field is to an extent the same as that of large effective reflection area and optical reflectivity. Furthermore, simulation results with uncoated CCR presents a higher relevance of incidence direction and FFDP.</sec><sec>To verify the reliability and correctness of these simulation results, a diffraction optical experimental system at a wavelength of 1550 nm is set up to conduct laboratory confirmation, including laser, camera, beam expander, rotating platform and other essential optics. A silver-coated CCR and an uncoated CCR (both made of fuse silica, each has different dihedral angle offset) are chosen to measure their FFDPs with random polarization directions at several random incidence angles. All the measurement results are in good agreement with the simulations of FFDPs.</sec>

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The phase mode of reflected beam from laser retroreflector with dihedral angle and flatness error

Zhou

Zheng

2011

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Influence of Satellite Retroreflector Precision on Far-Field Diffraction Pattern

Cited by 6 publications

References 0 publications

Establishment and study on dihedral angle detection model of retro-reflector based on Zygo interferometer

Establishment and study on dihedral angle detection model of retro-reflector based on Zygo interferometer

Far-field diffraction pattern of cube corner retroreflector at oblique incidence

The phase mode of reflected beam from laser retroreflector with dihedral angle and flatness error

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