The influence of surface roughness scattering on electron lowfield mobility in thin undoped GaAs-in-Al 2 O 3 nanowires with rectangular cross-section is studied by means of the direct numerical solution of the Boltzmann transport equation at the electric quantum limit for different values of the nanowire cross-section dimensions, the nanowire temperature and the Fermi level in a one-dimensional electron gas. The formulae for calculation of surface roughness scattering matrix elements are derived in such a way that they contain the topological parameter D 2D characterizing the surface roughness instead of the physical one, D 1D , usually used.