Influence of seed layer on crystal orientation and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films prepared by a sol–gel process

Chi, Qingguo; Yang, Fan; Zhang, C.H.; Chen, C.T.; Zhu, Hanfei; Wang, X.; Liu, Qingquan

doi:10.1016/j.ceramint.2013.05.035

Cited by 12 publications

(1 citation statement)

References 18 publications

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“…All the samples show broadened (200) peaks, which can be assumed a variety of ferroelectric phases indicating that this film may be close to the morphotropic phase boundary (MPB) [17]. Benefiting from the MPB effect, superior piezoelectric performance can be expected [18]. Figure 2 shows cross-sectional morphologies of NKBT thin films obtained through different procedures.…”

Section: Introductionmentioning

confidence: 97%

Effects of seed layer and crystallization process on crystal orientation and properties of NKBT thin films

Cui

Wang

2015

J Sol-Gel Sci Technol

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Lead-free (Na 0.85 K 0.15 ) 0.5 Bi 0.5 TiO 3 (NKBT) piezoelectric thin films were fabricated via an aqueous solgel method on Pt(111)/Ti/SiO 2 /Si substrates. The thin films, with and without Pb 0.8 La 0.1 Ca 0.1 Ti 0.975 O 3 seed layer, were obtained by single-crystallization and multiple-crystallization processes. The NKBT thin films derived by multiple-crystallization process exhibited better single perovskite structure, and the films with PLCT seed layers were well crystallized with high (100) orientation. The effects that seed layer and different crystallization processes have on crystal orientation and electrical properties can be attributed to extrinsic and intrinsic contributions, and their different mechanism and ranges of improvement in the dielectricity and piezoelectricity are observed and discussed. The NKBT thin films that prepared by multiple crystallization with PLCT seed layer had the best electric property with e r of 598, tand of 0.08, and d 33 of 136 pm/V. Graphical Abstract

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Section: Introductionmentioning

confidence: 97%