Influence of sintering temperature on secondary phases formation and microwave dielectric properties of Ca2Ce2Ti5O16 ceramics

Abstract

Ca 2 Ce 2 Ti 5 O 16 dielectric ceramics prepared by conventional solid-state ceramic route was investigated. Phase composition and microwave dielectric properties were measured using XRD and Vector network analyzer, respectively. XRD analysis of the calcined and sintered samples revealed the formation of CeO 2 and another unidentified phase (that vanished at 1400°C) as secondary phases along with the parent Ca 2 Ce 2 Ti 5 O 16 phase. The amount of the parent Ca 2 Ce 2 Ti 5 O 16 phase increased with increasing sintering temperature from 1350°C to 1450°C accompanied by a decrease in the apparent density. The density decreased but ε r and Q u f o increased with sintering temperature. An ε r ∼ 81.5, Q u f o ∼ 5915 GHz and τ f ∼ 219 GHz were achieved for the sample sintered at 1450°C.