2019
DOI: 10.1080/14328917.2019.1597436
|View full text |Cite
|
Sign up to set email alerts
|

Influence of Sn and Mn on structural, optical and magnetic properties of spray pyrolysed CdS thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
11
0
3

Year Published

2019
2019
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 57 publications
(15 citation statements)
references
References 29 publications
1
11
0
3
Order By: Relevance
“…The calculated direct band gap values of Al -SnO 2 films lay in the range 3.62 eV to 2.63ev for Al doped and un doped SnO 2 respectively. Which are also comparable with the values already reported 3.604 to 4.105 eV [20], 3.87 to 4.21eV [18]. The band gap narrows down due to the decrease in the number of charge carriers with increasing in Al doping and annealing temperature.…”
Section: A Structural Propertiessupporting
confidence: 91%
See 1 more Smart Citation
“…The calculated direct band gap values of Al -SnO 2 films lay in the range 3.62 eV to 2.63ev for Al doped and un doped SnO 2 respectively. Which are also comparable with the values already reported 3.604 to 4.105 eV [20], 3.87 to 4.21eV [18]. The band gap narrows down due to the decrease in the number of charge carriers with increasing in Al doping and annealing temperature.…”
Section: A Structural Propertiessupporting
confidence: 91%
“…The effect of Al doping on SnO 2 has been investigated by various researchers in the past [17,18]. With increasing Al dopant and annealing temperature in the tin oxide film, the crystalline of SnO 2 decreased.…”
Section: A Structural Propertiesmentioning
confidence: 99%
“…1 filter paper. Later on, it was thoroughly washed with double distilled water under sterile conditions (Baş & Boyacı, 2007; Karthik, Pushpa, Madhukara Naik, & Vinuth, 2020). Periodically, synthesized CdO NPs were collected from the mixture that was ultracentrifuged at 5,000 rpm for 5 min.…”
Section: Methodsmentioning
confidence: 99%
“…The XRD spectra was recorded via d‐spacing value. The XRD (Model: DY‐1656) was operated using 40 KV (Kilovolt) at 2 θ ° 10°–80° in diffraction patterns with Cu K α ( λ = 1.542 A o ), and accelerated with 1°/min counting rate (Baghayeri, Mahdavi, Hosseinpor‐Mohsen Abadi, & Farhadi, 2018; Kannan, Dhanuskodi, et al, 2020; Karthik et al, 2020; Singh & Rajput, 2018). Using XRD data, we applied Scherer's formula to calculate the size of the crystallite.…”
Section: Methodsmentioning
confidence: 99%
“…The structural parameters like (dislocation density strain, and stacking fault) were also calculated from the XRD data by using Eqs. (2)-(4) respectively [33].…”
Section: Characterization Of Zno Nanoparticlementioning
confidence: 99%