2005
DOI: 10.1007/s10789-005-0211-0
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Influence of Structural Defects on the Mechanical Stress in the Impurity Diffusion Zone of GaAs Single Crystals

Abstract: Data are presented on the mechanical stress σ developing in the diffusion zone of gallium arsenide single crystals at different dislocation densities and relationships between the concentrations of arsenic and gallium vacancies. The results are analyzed in terms of impurity diffusion through gallium, arsenic, and interstitial sites. The influence of the defect system on σ is shown to depend on the mechanism of impurity diffusion. A correction coefficient which eliminates the discrepancy between experimental st… Show more

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Cited by 2 publications
(7 citation statements)
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“…Negative values of σ in initial crystals of group I are caused by the predominance of nonassociated vacancy defects over interstitial ones, whereas positive values of σ in crystals of group II are related to the predominance of nonassociated interstitial defects over vacancy ones [5,6]. The well-known results of radiographic and metallographic investigations of the influence of various HT conditions on the formation of microdefects (MD) in undoped GaAs single crystals [1] allow one to explain the character of the dependences σ = f (t) obtained in this work in the following way.…”
Section: Change Of Mechanical Stressesmentioning
confidence: 95%
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“…Negative values of σ in initial crystals of group I are caused by the predominance of nonassociated vacancy defects over interstitial ones, whereas positive values of σ in crystals of group II are related to the predominance of nonassociated interstitial defects over vacancy ones [5,6]. The well-known results of radiographic and metallographic investigations of the influence of various HT conditions on the formation of microdefects (MD) in undoped GaAs single crystals [1] allow one to explain the character of the dependences σ = f (t) obtained in this work in the following way.…”
Section: Change Of Mechanical Stressesmentioning
confidence: 95%
“…These samples were cut from Czochralski-grown SIU GaAs (100) single crystals with the n-type of conductivity. In such crystals, it is possible to estimate the concentration of vacancies and interstitial defects (gallium vacancies [V Ga ], arsenic vacancies [V As ], and interstitial arsenic [As i ]) using photoluminescence (PL) spectra and data on mechanical stresses σ, respectively [4,5].…”
Section: Methodsmentioning
confidence: 99%
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