1984
DOI: 10.1016/0165-1633(84)90051-0
|View full text |Cite
|
Sign up to set email alerts
|

Influence of temperature and illumination intensity on the InP/CdS hetero-photocells characteristics

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
2
0

Year Published

1990
1990
2009
2009

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 7 publications
0
2
0
Order By: Relevance
“…3 and 4 that the increase of the fill factor (FF = I m V m /I sc V oc ) is due to the decrease of the open-circuit voltage (V oc ) and the fall-off of the series resistance at higher temperatures. The increase of the short-circuit current density up to 125 × 10 −5 A · cm −2 at 343 K is a result of the carrier diffusion length increase at higher temperatures and also a result of the absorption edge shift to the lower energies caused by the E g decrease [12]. As a whole we can conclude that the increase of the fill factor and the short-circuit current density is the contributory effect for the decrease of the open-circuit voltage (V oc ) due to the decrease of the voltage temperature coefficient K T (V oc ) and the fall-off of the series resistance at higher temperatures.…”
Section: Resultsmentioning
confidence: 98%
See 1 more Smart Citation
“…3 and 4 that the increase of the fill factor (FF = I m V m /I sc V oc ) is due to the decrease of the open-circuit voltage (V oc ) and the fall-off of the series resistance at higher temperatures. The increase of the short-circuit current density up to 125 × 10 −5 A · cm −2 at 343 K is a result of the carrier diffusion length increase at higher temperatures and also a result of the absorption edge shift to the lower energies caused by the E g decrease [12]. As a whole we can conclude that the increase of the fill factor and the short-circuit current density is the contributory effect for the decrease of the open-circuit voltage (V oc ) due to the decrease of the voltage temperature coefficient K T (V oc ) and the fall-off of the series resistance at higher temperatures.…”
Section: Resultsmentioning
confidence: 98%
“…The peak in the fill factors is seen to be 45.76 % at a temperature of 343 K. Exactly the same is the case for the short-circuit current density versus temperature curves. It is found that the open-circuit voltage (V oc ) of the junction Sn/(n)ZnO exhibits a linear decrease with the temperature rise and with a decrease of the voltage temperature coefficient, K T (V oc ), using the expression[12]…”
mentioning
confidence: 99%