1999
DOI: 10.1109/6144.814966
|View full text |Cite
|
Sign up to set email alerts
|

Influence of temperature, humidity, and defect location on delamination in plastic IC packages

Abstract: The modified J-integral and the stress intensity factor based on linear elastic fracture mechanics can be applied to predict the growth of interfacial delamination in integrated circuit (IC) packages. One of the key parameters required is the interfacial fracture toughness. This paper describes the measurement of the interfacial fracture toughness as a function of temperature and relative humidity using a three-point bending test. The interfacial fracture toughness was found to decrease with temperature and re… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
8
0

Year Published

2008
2008
2023
2023

Publication Types

Select...
4
2
2

Relationship

0
8

Authors

Journals

citations
Cited by 59 publications
(8 citation statements)
references
References 22 publications
0
8
0
Order By: Relevance
“…A plane strain two-dimensional (2D) finite element (FE) model according to [16] was established to simulate interfacial crack growth between epoxy coating and substrate under thermal or hygroscopic stress (see Figure 1), using a commercial FE package ABAQUS, based on linear elastic fracture mechanics [17]. The coating was perfectly bonded to the substrate, except the edge and central pre-cracks at the coating/substrate interface (highlighted in red colour).…”
Section: Finite Element Modelmentioning
confidence: 99%
“…A plane strain two-dimensional (2D) finite element (FE) model according to [16] was established to simulate interfacial crack growth between epoxy coating and substrate under thermal or hygroscopic stress (see Figure 1), using a commercial FE package ABAQUS, based on linear elastic fracture mechanics [17]. The coating was perfectly bonded to the substrate, except the edge and central pre-cracks at the coating/substrate interface (highlighted in red colour).…”
Section: Finite Element Modelmentioning
confidence: 99%
“…In general, there are three types of failure mechanisms when an electronic package is exposed to humidity conditions. The first type of failure is often referred to 'popcorn failure' [4][5][6][7]. Packaged microelectronic devices are exposed to factory environmental conditions after the opening of protective dry-bags for surface mounting to printed circuit board (PCB).…”
Section: Introductionmentioning
confidence: 99%
“…( 1 1 ) when the Csat uses the unit of g/cm 3 . In general, the C sat depends on the relative humidity and temperature.…”
Section: Characterization Of Porosity and Free Volumementioning
confidence: 99%
“…C (kg/m 3 ) is the penetrant concentration, t (s) the time, and D (m 2 / s) is the diffusion coefficient or diffusivity of the moisture in the polymer. D is the pivotal parameter determining the rate of transport.…”
Section: Fickian and Non-fickian Kineticsmentioning
confidence: 99%
See 1 more Smart Citation