2023
DOI: 10.3390/ma16062197
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Influence of the Addition of Rare Earth Elements on the Energy Storage and Optical Properties of Bi0.5Na0.5TiO3–0.06BaTiO3 Polycrystalline Thin Films

Abstract: Rare earth element-doped Bi0.5Na0.5TiO3–BaTiO3 (BNT–BT–RE) polycrystalline thin films were processed on a platinized substrate by chemical solution deposition. The microstructure, dielectric, and ferroelectric properties were investigated for all prepared films. It was found that the incorporation of rare earth elements into the BNT–BT matrix increases both the dielectric constant and the breakdown strength while maintaining low dielectric losses, leading to an enhancement of the energy storage density to Wrec… Show more

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Cited by 4 publications
(4 citation statements)
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“…In contrast, a clear dielectric loss anomaly was observed around 120 °C at 10 kHz for the film prepared via the CSD method, which corresponds exactly to depolarization temperature localization. As shown in Figure 4b, this anomaly was frequency-dependent and asserted the relaxor behavior of this film [31]. Such an anomaly in…”
Section: Dielectric Investigation and Thermal Permittivity Stabilitysupporting
confidence: 54%
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“…In contrast, a clear dielectric loss anomaly was observed around 120 °C at 10 kHz for the film prepared via the CSD method, which corresponds exactly to depolarization temperature localization. As shown in Figure 4b, this anomaly was frequency-dependent and asserted the relaxor behavior of this film [31]. Such an anomaly in…”
Section: Dielectric Investigation and Thermal Permittivity Stabilitysupporting
confidence: 54%
“…In contrast, a clear dielectric loss anomaly was observed around 120 • C at 10 kHz for the film prepared via the CSD method, which corresponds exactly to depolarization temperature localization. As shown in Figure 4b, this anomaly was frequency-dependent and asserted the relaxor behavior of this film [31]. Such an anomaly in the dielectric loss was not detected for the film prepared via the PLD method, probably because of the presence of a high leakage current and/or a rather low concentration of polar nanoclusters, which could not give rise to such an anomaly.…”
Section: Dielectric Investigation and Thermal Permittivity Stabilitymentioning
confidence: 72%
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