Influence of the Annealing Environment on the Structure and Ferroelectric Properties of Lead Titanate Thin Films

Abstract

Lead titanate thin films of pyrochlore phase were deposited using layer-by-layer reactive magnetron sputtering on a heated platinized silicon substrate. It was found that the pyrochlore phase transition to the perovskite phase was initiated at 700 °C, and the properties of the PbTiO3 films could be controlled by changing the annealing environment. The thin films annealed in air and oxygen environments (1.33 Pa) have a tetragonal structure. The highest values of remnant polarization and the coercive field were 38 μC/cm2 and 130 kV/cm, respectively, but the largest dielectric loss was determined for the films annealed in air. The remnant polarization, coercive field and dielectric loss were reduced when the annealing of films was performed using oxygen gas at 1.33 Pa pressure. The films annealed in vacuum showed a rhombohedral (and ferroelectric) structure with the lowest remnant polarization and coercive field values. Such a structure was not observed for lead titanate at room temperature. It was observed that the surface morphology strongly depended on the reaction rate, which was influenced by the oxygen concentration in the environment.