2010
DOI: 10.1016/j.apsusc.2010.03.023
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Influence of the broken symmetry of defect state distribution at the a-Si:H/c-Si interface on the performance of hetero-junction solar cells

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Cited by 17 publications
(6 citation statements)
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“…As described in Ref. [21], the doping concentration of the emitter layer will affect the performance of an a-Si:H (n)/c-Si(p) heterojunction solar cell obviously. So, the effect of doping concentration of the emitter layer on the performance of the silicon thin film heterojunction solar cell is also studied here.…”
Section: Resultsmentioning
confidence: 99%
“…As described in Ref. [21], the doping concentration of the emitter layer will affect the performance of an a-Si:H (n)/c-Si(p) heterojunction solar cell obviously. So, the effect of doping concentration of the emitter layer on the performance of the silicon thin film heterojunction solar cell is also studied here.…”
Section: Resultsmentioning
confidence: 99%
“…The thin film PEC photocathodes were prepared with following layer sequence: Glass-ITO/a-SiC:H(p) 50nm ASA simulation software [16] was used for simulation of light I − V curves of solar cells. Input parameters for SHJ model used during the simulation were adopted from [17,18]. The incident solar spectrum used in ASA for estimation of PEC-PV efficiency was calculated by considering the transmittance of PEC samples and solar spectrum.…”
Section: Methodsmentioning
confidence: 99%
“…To understand the impact of such trap states on photoanodes, we shall utilize a semiclassical model describing the trapping/detrapping dynamics of intermediate band-gap states. The approach we employ was originally developed to understand the operation of solid-state semiconductor devices prone to trapping. ,, A particular example would be the simulation of silicon heterojunction solar cells. Now, Figure presents a generic picture of carrier trapping/detrapping events by intermediate states. Here, we show trap states with both acceptor and donor characteristics inside a band gap.…”
Section: Methodsmentioning
confidence: 99%
“…Thus, the total charge contribution from a distribution of acceptor states is ,, Similarly, the concentration of holes captured by a donor state located at energy E , position x , and electrostatic potential ϕ is given by , and the total charge provided by the distribution of donor states is expressed as Finally, the net charge contribution from the distribution of bulk trap states of both acceptor and donor type is computed as In our analysis of ρ T , we have approximated g T|A and g T|D to take a normal distribution with respect to energy (see Figure ), following state-of-the-art modeling efforts regarding trap states inside disordered semiconductors by the device physics community (e.g., amorphous silicon). For instance, in our computation, g T|A is given by here, E T|A and W T|A /√2, respectively, are the location of the peak and the standard deviation of the distribution in electron volts, and Ñ T|A is the total number of acceptor-type trap states in the band gap in cm –3 . Importantly, a normal distribution conserves the total number of states ( Ñ T|A ) even when the peak location and spread are altered.…”
Section: Methodsmentioning
confidence: 99%