“…Thus, the total charge contribution from a distribution of acceptor states is ,, Similarly, the concentration of holes captured by a donor state located at energy E , position x , and electrostatic potential ϕ is given by , and the total charge provided by the distribution of donor states is expressed as Finally, the net charge contribution from the distribution of bulk trap states of both acceptor and donor type is computed as In our analysis of ρ T , we have approximated g T|A and g T|D to take a normal distribution with respect to energy (see Figure ), following state-of-the-art modeling efforts regarding trap states inside disordered semiconductors by the device physics community (e.g., amorphous silicon). − For instance, in our computation, g T|A is given by here, E T|A and W T|A /√2, respectively, are the location of the peak and the standard deviation of the distribution in electron volts, and Ñ T|A is the total number of acceptor-type trap states in the band gap in cm –3 . Importantly, a normal distribution conserves the total number of states ( Ñ T|A ) even when the peak location and spread are altered.…”